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Investigation of temperature fields in microelectronic devices of layered structure with through inclusions

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Bibliographic Details
Date:	2017
Main Authors:	V. I. Gavrysh, R. B. Tushnitskij, Ja. Krajovskij, E. V. Levus
Format:	Article
Language:	English
Published:	2017
Series:	Electronic modeling
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000800015
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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