Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"

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Bibliographic Details
Date:2016
Main Author: Yu. Liashuha
Format: Article
Language:English
Published: 2016
Series:Questions of History of Science and Technology
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000672417
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-511682024-02-29T12:59:52Z Information technology and patent-licensing of the National Scientific Center "Institute of Metrology" Yu. Liashuha 2077-9496 2016 en Questions of History of Science and Technology http://jnas.nbuv.gov.ua/article/UJRN-0000672417 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Questions of History of Science and Technology
spellingShingle Questions of History of Science and Technology
Yu. Liashuha
Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"
format Article
author Yu. Liashuha
author_facet Yu. Liashuha
author_sort Yu. Liashuha
title Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"
title_short Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"
title_full Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"
title_fullStr Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"
title_full_unstemmed Information technology and patent-licensing of the National Scientific Center "Institute of Metrology"
title_sort information technology and patent-licensing of the national scientific center "institute of metrology"
publishDate 2016
url http://jnas.nbuv.gov.ua/article/UJRN-0000672417
work_keys_str_mv AT yuliashuha informationtechnologyandpatentlicensingofthenationalscientificcenterquotinstituteofmetrologyquot
first_indexed 2025-07-17T22:38:39Z
last_indexed 2025-07-17T22:38:39Z
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