Buchumschlag

Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy

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Bibliographische Detailangaben
Datum:	2016
Hauptverfasser:	S. S. Ponomaryov, V. O. Yukhymchuk, Ya. Valakh
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	2016
Schriftenreihe:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000714433
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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