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Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy

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Bibliographic Details
Date:	2016
Main Authors:	S. S. Ponomaryov, V. O. Yukhymchuk, Ya. Valakh
Format:	Article
Language:	English
Published:	2016
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000714433
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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