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Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals

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Bibliographic Details
Date:	2016
Main Authors:	G. S. Pekar, A. A. Singaevsky, A. F. Singaevsky
Format:	Article
Language:	English
Published:	2016
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000714528
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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