Effect of tin on structural transformations in the thin-film silicon suboxide matrix
Saved in:
| Date: | 2016 |
|---|---|
| Main Authors: | V. V. Voitovych, R. M. Rudenko, V. O. Yukhymchuk, M. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, Yu. Povarchuk, I. M. Khatsevych, M. P. Rudenko |
| Format: | Article |
| Language: | English |
| Published: |
2016
|
| Series: | Ukrainian Journal of Physics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000732704 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
Effect of tin on structural transformations in the thin-film silicon suboxide matrix
by: V. V. Voitovych, et al.
Published: (2016)
by: V. V. Voitovych, et al.
Published: (2016)
Behavior of hydrogen during crystallization of thin silicon films doped with tin
by: R. M. Rudenko, et al.
Published: (2013)
by: R. M. Rudenko, et al.
Published: (2013)
Formation of nanocrystalline silicon in tin-doped amorphous silicon films
by: R. M. Rudenko, et al.
Published: (2020)
by: R. M. Rudenko, et al.
Published: (2020)
Behavior of hydrogen during crystallization of thin silicon films doped with tin
by: R. M. Rudenko, et al.
Published: (2013)
by: R. M. Rudenko, et al.
Published: (2013)
Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
by: R. M. Rudenko, et al.
Published: (2013)
by: R. M. Rudenko, et al.
Published: (2013)
Formation of nanocrystalline silicon in tin-doped amorphous silicon films
by: R. M. Rudenko, et al.
Published: (2020)
by: R. M. Rudenko, et al.
Published: (2020)
Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
by: R. M. Rudenko, et al.
Published: (2013)
by: R. M. Rudenko, et al.
Published: (2013)
Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
by: M. M. Krasko, et al.
Published: (2018)
by: M. M. Krasko, et al.
Published: (2018)
Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
by: M. M. Krasko, et al.
Published: (2018)
by: M. M. Krasko, et al.
Published: (2018)
Tin doping effect on crystallization of amorphous silicon, obtained by vapor deposition in vacuum
by: V. B. Neimash, et al.
Published: (2013)
by: V. B. Neimash, et al.
Published: (2013)
About suboxide form of oxygen in steels and cast irons
by: V. G. Ivanov, et al.
Published: (2018)
by: V. G. Ivanov, et al.
Published: (2018)
Mechanism of tin-induced crystallization in amorphous silicon
by: V. B. Neimash, et al.
Published: (2014)
by: V. B. Neimash, et al.
Published: (2014)
Mechanism of tin-induced crystallization in amorphous silicon
by: V. B. Neimash, et al.
Published: (2014)
by: V. B. Neimash, et al.
Published: (2014)
A study of electrodeposited thin tin films in cycling in aprotic solvents
by: N. I. Globa, et al.
Published: (2014)
by: N. I. Globa, et al.
Published: (2014)
Doping by silicon and photovoltaic properties of thin thulium sesquisulfide films
by: Z. U. Dzhabua, et al.
Published: (2014)
by: Z. U. Dzhabua, et al.
Published: (2014)
Optoelectronic properties of hydrogenated amorphous silicon–carbon and nanocrystalline-silicon thin films
by: B. A. Najafov, et al.
Published: (2013)
by: B. A. Najafov, et al.
Published: (2013)
Optoelectronic properties of hydrogenated amorphous silicon–carbon and nanocrystalline-silicon thin films
by: B. A. Nadzhafov, et al.
Published: (2013)
by: B. A. Nadzhafov, et al.
Published: (2013)
Influence of the thermally activated structural converting in the tin dioxide thin film on their electric properties
by: G. S. Khripunov, et al.
Published: (2014)
by: G. S. Khripunov, et al.
Published: (2014)
Influence of tin impurity on recombination characteristics in γ-irradiated n-Si
by: M. M. Krasko
Published: (2012)
by: M. M. Krasko
Published: (2012)
Influence of tin impurity on recombination characteristics in γ-irradiated n-Si
by: M. M. Krasko
Published: (2012)
by: M. M. Krasko
Published: (2012)
Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si
by: M. M. Krasko
Published: (2013)
by: M. M. Krasko
Published: (2013)
Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si
by: M. M. Krasko
Published: (2013)
by: M. M. Krasko
Published: (2013)
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
by: K. M. Al-Adamat, et al.
Published: (2021)
by: K. M. Al-Adamat, et al.
Published: (2021)
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
by: K. M. Al-Adamat, et al.
Published: (2021)
by: K. M. Al-Adamat, et al.
Published: (2021)
Influence of surface and intergrain boundaries scattering mechanisms of current carriers in thin films based on tin telluride
by: D. M. Freik, et al.
Published: (2014)
by: D. M. Freik, et al.
Published: (2014)
Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs
by: T. Rudenko, et al.
Published: (2013)
by: T. Rudenko, et al.
Published: (2013)
Raman scattering in the process of tin-induced crystallization of amorphous silicon
by: V. Neimash, et al.
Published: (2016)
by: V. Neimash, et al.
Published: (2016)
Microstructure of thin Si−Sn composite films
by: V. B. Neimash, et al.
Published: (2013)
by: V. B. Neimash, et al.
Published: (2013)
Raman scattering in the process of tin-induced crystallization of amorphous silicon
by: V. B. Neimash, et al.
Published: (2016)
by: V. B. Neimash, et al.
Published: (2016)
Some thermodynamic effects in thin film adhesion
by: Chornous, A.M., et al.
Published: (2005)
by: Chornous, A.M., et al.
Published: (2005)
Microstructure of thin Si−Sn composite films
by: V. B. Neimash, et al.
Published: (2013)
by: V. B. Neimash, et al.
Published: (2013)
Magnetic and Relaxation Phenomena in Film Si—TiN—Fe Heterostructures with Carbon Nanotubes
by: E. M. Rudenko, et al.
Published: (2015)
by: E. M. Rudenko, et al.
Published: (2015)
Size effects in thin PbSe films
by: E. I. Rogacheva, et al.
Published: (2012)
by: E. I. Rogacheva, et al.
Published: (2012)
Evidence for photochemical transformations in porous silicon
by: Shevchenko, V.B., et al.
Published: (1999)
by: Shevchenko, V.B., et al.
Published: (1999)
Radiation-stimulated processes in silicon structures with contacts based on TiN
by: M. U. Nasyrov, et al.
Published: (2015)
by: M. U. Nasyrov, et al.
Published: (2015)
Radiation-stimulated processes in silicon structures with contacts based on TiN
by: Nasyrov, M.U., et al.
Published: (2015)
by: Nasyrov, M.U., et al.
Published: (2015)
Tin-induced crystallization of amorphous silicon under pulsed laser irradiation
by: V. B. Neimash, et al.
Published: (2017)
by: V. B. Neimash, et al.
Published: (2017)
Tin-induced crystallization of amorphous silicon under pulsed laser irradiation
by: V. B. Neimash, et al.
Published: (2017)
by: V. B. Neimash, et al.
Published: (2017)
On the Growth of the Cauchy-Szegő Transform in the Unit Ball
by: Chyzhykov, I., et al.
Published: (2015)
by: Chyzhykov, I., et al.
Published: (2015)
On the Growth of the Cauchy-Szegő Transform in the Unit Ball
by: I. Chyzhykov, et al.
Published: (2015)
by: I. Chyzhykov, et al.
Published: (2015)
Similar Items
-
Effect of tin on structural transformations in the thin-film silicon suboxide matrix
by: V. V. Voitovych, et al.
Published: (2016) -
Behavior of hydrogen during crystallization of thin silicon films doped with tin
by: R. M. Rudenko, et al.
Published: (2013) -
Formation of nanocrystalline silicon in tin-doped amorphous silicon films
by: R. M. Rudenko, et al.
Published: (2020) -
Behavior of hydrogen during crystallization of thin silicon films doped with tin
by: R. M. Rudenko, et al.
Published: (2013) -
Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
by: R. M. Rudenko, et al.
Published: (2013)