Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films
Gespeichert in:
| Datum: | 2015 |
|---|---|
| Hauptverfasser: | O. S. Skakunova, S. Y. Olikhovskyi, V. B. Molodkin, Ye. H. Len, Ye. M. Kyslovskyi, O. V. Reshetnyk, T. P. Vladimirova, Ye. V. Kochelab, V. V. Lizunov, S. V. Lizunova, V. L. Makivska, M. H. Tolmachov, L. M. Skapa, Ya. V. Vasylyk, K. V. Fuzik |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
2015
|
| Schriftenreihe: | Metallophysics and advanced technologies |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0000551400 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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