Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
Gespeichert in:
| Datum: | 2021 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
2021
|
| Schriftenreihe: | Ukrainian Journal of Physics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-6880 |
|---|---|
| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-68802024-02-25T16:07:12Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 0372-400X 2021 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0001276626 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Ukrainian Journal of Physics |
| spellingShingle |
Ukrainian Journal of Physics K. M. Al-Adamat H. M. El-Nasser Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| format |
Article |
| author |
K. M. Al-Adamat H. M. El-Nasser |
| author_facet |
K. M. Al-Adamat H. M. El-Nasser |
| author_sort |
K. M. Al-Adamat |
| title |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_short |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_fullStr |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full_unstemmed |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_sort |
characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| publishDate |
2021 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
| work_keys_str_mv |
AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry |
| first_indexed |
2025-07-17T11:27:16Z |
| last_indexed |
2025-07-17T11:27:16Z |
| _version_ |
1850411426197274624 |