Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
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| Date: | 2021 |
|---|---|
| Main Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
2021
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| Series: | Ukrainian Journal of Physics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859488103497990144 |
|---|---|
| author | K. M. Al-Adamat H. M. El-Nasser |
| author_facet | K. M. Al-Adamat H. M. El-Nasser |
| author_sort | K. M. Al-Adamat |
| collection | Open-Science |
| first_indexed | 2025-07-17T11:27:16Z |
| format | Article |
| id | open-sciencenbuvgovua-6880 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T11:27:16Z |
| publishDate | 2021 |
| record_format | dspace |
| series | Ukrainian Journal of Physics |
| spelling | open-sciencenbuvgovua-68802024-02-25T16:07:12Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 0372-400X 2021 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0001276626 Article |
| spellingShingle | Ukrainian Journal of Physics K. M. Al-Adamat H. M. El-Nasser Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_fullStr | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full_unstemmed | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_short | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_sort | characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
| work_keys_str_mv | AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry |