Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
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| Date: | 2021 |
|---|---|
| Main Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
2021
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| Series: | Ukrainian Journal of Physics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-6880 |
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open-sciencenbuvgovua-68802024-02-25T16:07:12Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 0372-400X 2021 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0001276626 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Ukrainian Journal of Physics |
| spellingShingle |
Ukrainian Journal of Physics K. M. Al-Adamat H. M. El-Nasser Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| format |
Article |
| author |
K. M. Al-Adamat H. M. El-Nasser |
| author_facet |
K. M. Al-Adamat H. M. El-Nasser |
| author_sort |
K. M. Al-Adamat |
| title |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_short |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_fullStr |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full_unstemmed |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_sort |
characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| publishDate |
2021 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
| work_keys_str_mv |
AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry |
| first_indexed |
2025-07-17T11:27:16Z |
| last_indexed |
2025-07-17T11:27:16Z |
| _version_ |
1850411426197274624 |