Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
Saved in:
| Date: | 2013 |
|---|---|
| Main Authors: | A. V. Sachenko, V. P. Kostylev, V. G. Litovchenko, V. G. Popov, B. M. Romanyuk, V. V. Chernenko, V. M. Naseka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov |
| Format: | Article |
| Language: | English |
| Published: |
2013
|
| Series: | Ukrainian journal of physics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000688686 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
by: A. V. Sachenko, et al.
Published: (2013)
by: A. V. Sachenko, et al.
Published: (2013)
Investigation of the undersurface damaged layers in silicon wafers
by: Holiney, R.Yu., et al.
Published: (1999)
by: Holiney, R.Yu., et al.
Published: (1999)
Reduction of recombination losses in near-surface diffusion emitter layers of photosensitive silicon n+-p-p+ structures
by: V. P. Kostylyov, et al.
Published: (2023)
by: V. P. Kostylyov, et al.
Published: (2023)
Two-channel gettering of recombination-active impurity in polycrystalline solar silicon
by: V. G. Litovchenko, et al.
Published: (2012)
by: V. G. Litovchenko, et al.
Published: (2012)
Analysis of features of recombination mechanisms in silicon solar cells
by: R. M. Korkishko, et al.
Published: (2014)
by: R. M. Korkishko, et al.
Published: (2014)
Analysis of features of recombination mechanisms in silicon solar cells
by: Korkishko, R.M., et al.
Published: (2014)
by: Korkishko, R.M., et al.
Published: (2014)
Influence of surface centers on the effective surface recombination rate and the parameters of silicon solar cells
by: V. P. Kostylyov, et al.
Published: (2013)
by: V. P. Kostylyov, et al.
Published: (2013)
Influence of surface centers on the effective surface recombination rate and the parameters of silicon solar cells
by: V. P. Kostylov, et al.
Published: (2013)
by: V. P. Kostylov, et al.
Published: (2013)
Influence of nanostructured ITO films on surface recombination processes in silicon solar cells
by: V. P. Kostylyov, et al.
Published: (2015)
by: V. P. Kostylyov, et al.
Published: (2015)
Influence of nanostructured ITO films on surface recombination processes in silicon solar cells
by: Kostylyov, V.P., et al.
Published: (2015)
by: Kostylyov, V.P., et al.
Published: (2015)
Surface photovoltage spectroscopy research of solar silicon recombination parameters
by: V. G. Litovchenko
Published: (2015)
by: V. G. Litovchenko
Published: (2015)
Characteristics of gettering process in multicrystalline Si wafers with combined porous Si/Al getters
by: A. Sarikov, et al.
Published: (2012)
by: A. Sarikov, et al.
Published: (2012)
Exciton-enhanced recombination in silicon at high concentrations of charge carriers
by: Sachenko, A.V., et al.
Published: (2000)
by: Sachenko, A.V., et al.
Published: (2000)
Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments
by: Gorbach, T.Ya., et al.
Published: (1998)
by: Gorbach, T.Ya., et al.
Published: (1998)
Features in the formation of a recombination current in the space charge region of silicon solar cells
by: A. V. Sachenko, et al.
Published: (2016)
by: A. V. Sachenko, et al.
Published: (2016)
Features in the formation of a recombination current in the space charge region of silicon solar cells
by: A. V. Sachenko, et al.
Published: (2016)
by: A. V. Sachenko, et al.
Published: (2016)
Research of recombination characteristics of Cz-Si implanted with iron ions
by: D. V. Gamov, et al.
Published: (2013)
by: D. V. Gamov, et al.
Published: (2013)
Electron beam purification of crystalline silicon
by: V. A. Berezos
Published: (2013)
by: V. A. Berezos
Published: (2013)
Influence of SiOx-film deposited by thermal evaporation on the near-bandedge luminescence of mono-crystalline silicon
by: N. A. Vlasenko, et al.
Published: (2010)
by: N. A. Vlasenko, et al.
Published: (2010)
Influence of non-radiative exciton recombination in silicon on photoconversion efficiency. 2. Short Shockley-Read-Hall lifetimes
by: A. V. Sachenko, et al.
Published: (2017)
by: A. V. Sachenko, et al.
Published: (2017)
Influence of non-radiative exciton recombination in silicon on photoconversion efficiency. 2. Short Shockley–Read–Hall lifetimes
by: Sachenko, A.V., et al.
Published: (2017)
by: Sachenko, A.V., et al.
Published: (2017)
Balance model for contactless chemo-mechanical polishing of wafers
by: Grigoriev, N.N., et al.
Published: (2002)
by: Grigoriev, N.N., et al.
Published: (2002)
The process of forming the polycrystalline silicon wafer from the powder raw material and analyzing the impurity composition of their surface
by: R. Aliev, et al.
Published: (2011)
by: R. Aliev, et al.
Published: (2011)
Ultrasound effect on radiation damages in boron implanted silicon
by: Romanjuk, B., et al.
Published: (2000)
by: Romanjuk, B., et al.
Published: (2000)
Surface photovoltage spectroscopy research of solar silicon recombination parameters
by: V. H. Lytovchenko
Published: (2015)
by: V. H. Lytovchenko
Published: (2015)
Relaxation of Magnetosensitive Impurities in Single-Crystalline Silicon
by: V. A. Makara, et al.
Published: (2013)
by: V. A. Makara, et al.
Published: (2013)
The influence of non-uniform deformation on photoelectric properties of crystalline silicon
by: Vakulenko, O.V., et al.
Published: (2000)
by: Vakulenko, O.V., et al.
Published: (2000)
The influence of the exciton non-radiative recombination in silicon on the photoconversion efficiency. 1. Long Shockley–Read–Hall lifetimes
by: Sachenko, A.V., et al.
Published: (2016)
by: Sachenko, A.V., et al.
Published: (2016)
Model of smoothing roughness on GaAs wafer surface by using nonabrasive chemical-and-mechanical polishing
by: A. V. Fomin, et al.
Published: (2017)
by: A. V. Fomin, et al.
Published: (2017)
Two-channel gettering of recombination-active impurity in polycrystalline solar silicon
by: V. H. Lytovchenko, et al.
Published: (2012)
by: V. H. Lytovchenko, et al.
Published: (2012)
Stabilization of nano-sized structures in the volume of single-crystalline silicon for photoconverters
by: Dovbnya, A.N., et al.
Published: (2009)
by: Dovbnya, A.N., et al.
Published: (2009)
Model of smoothing roughness on GaAs wafer surface by using nonabrasive chemical-and-mechanical polishing
by: Fomin, A.V., et al.
Published: (2017)
by: Fomin, A.V., et al.
Published: (2017)
Recombination parameters of point defects in dislocation-free silicon single crystals
by: Talanin, V.I., et al.
Published: (2006)
by: Talanin, V.I., et al.
Published: (2006)
The influence of the exciton non-radiative recombination in silicon on the photoconversion efficiency. 1. The case of a long Shockley–Read–Hall lifetime
by: A. V. Sachenko, et al.
Published: (2016)
by: A. V. Sachenko, et al.
Published: (2016)
Effect of L-arginine on the optical properties, crystalline perfection and laser damage threshold of KDP crystals
by: Kostenyukova, E.I., et al.
Published: (2015)
by: Kostenyukova, E.I., et al.
Published: (2015)
Effect of excitons on photoconversion efficiency in the p⁺-n-n⁺- and n⁺-p-p⁺-structures based on single-crystalline silicon
by: Gorban, A.P., et al.
Published: (2000)
by: Gorban, A.P., et al.
Published: (2000)
Investigations of impurity gettering in multicrystalline silicon
by: Evtukh, A.A., et al.
Published: (2001)
by: Evtukh, A.A., et al.
Published: (2001)
Photocatalysis and optical properties of ZnO nanostructures grown by MOCVD on Si, Au/Si and Ag/Si wafers
by: V. A. Karpyna, et al.
Published: (2023)
by: V. A. Karpyna, et al.
Published: (2023)
Back surface reflector optimization for thin single crystalline silicon solar cells
by: Kopach, V.R., et al.
Published: (2007)
by: Kopach, V.R., et al.
Published: (2007)
Electrostatic Field Tensities near Irregularities of Porous Silicon Surface
by: Terebinska, M.I., et al.
Published: (2010)
by: Terebinska, M.I., et al.
Published: (2010)
Similar Items
-
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
by: A. V. Sachenko, et al.
Published: (2013) -
Investigation of the undersurface damaged layers in silicon wafers
by: Holiney, R.Yu., et al.
Published: (1999) -
Reduction of recombination losses in near-surface diffusion emitter layers of photosensitive silicon n+-p-p+ structures
by: V. P. Kostylyov, et al.
Published: (2023) -
Two-channel gettering of recombination-active impurity in polycrystalline solar silicon
by: V. G. Litovchenko, et al.
Published: (2012) -
Analysis of features of recombination mechanisms in silicon solar cells
by: R. M. Korkishko, et al.
Published: (2014)