Tsysar, M. A. (2013). Studies of topological features of the surface relief formation of titanium nitride films on silicon substrates during the diffusion mass transfer and on annealing using scanning tunneling microscopy.
Чикаго стиль цитування (17-те видання)Tsysar, M. A. Studies of Topological Features of the Surface Relief Formation of Titanium Nitride Films on Silicon Substrates During the Diffusion Mass Transfer and on Annealing Using Scanning Tunneling Microscopy. 2013.
Стиль цитування MLA (8-ме видання)Tsysar, M. A. Studies of Topological Features of the Surface Relief Formation of Titanium Nitride Films on Silicon Substrates During the Diffusion Mass Transfer and on Annealing Using Scanning Tunneling Microscopy. 2013.
Попередження: стилі цитування не завжди правильні на всі 100%.