Tsysar, M. A. (2013). Studies of topological features of the surface relief formation of titanium nitride films on silicon substrates during the diffusion mass transfer and on annealing using scanning tunneling microscopy.
Chicago Style (17th ed.) CitationTsysar, M. A. Studies of Topological Features of the Surface Relief Formation of Titanium Nitride Films on Silicon Substrates During the Diffusion Mass Transfer and on Annealing Using Scanning Tunneling Microscopy. 2013.
MLA (8th ed.) CitationTsysar, M. A. Studies of Topological Features of the Surface Relief Formation of Titanium Nitride Films on Silicon Substrates During the Diffusion Mass Transfer and on Annealing Using Scanning Tunneling Microscopy. 2013.
Warning: These citations may not always be 100% accurate.