Studies of topological features of the surface relief formation of titanium nitride films on silicon substrates during the diffusion mass transfer and on annealing using scanning tunneling microscopy
Saved in:
| Date: | 2013 |
|---|---|
| Main Author: | M. A. Tsysar |
| Format: | Article |
| Language: | English |
| Published: |
2013
|
| Series: | Superhard Materials |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000695825 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Scanning Acoustic Microscopy of Annealing Effects for Aluminium Thin Film Deposited on Silicon Substrate
by: Chafia Atailia, et al.
Published: (2018) -
Spatial resolution of scanning tunneling microscopy
by: Rozouvan, T., et al.
Published: (2015) -
Investigation of Ag2O–B2O3-system glass by means of the method of scanning tunnelling microscopy with semicon-ducting diamond tip
by: M. A. Tsysar
Published: (2012) -
Studies of topological features of the surface of HFCVD nanocrys-talline diamond film using a scanning tunneling microscope with a diamond tip
by: M. A. Tsysar
Published: (2012) -
Scanning-tunneling microscopy/spectroscopy and break-junction tunneling spectroscopy of FeSe₁–xTex
by: Ekino, T., et al.
Published: (2013)