Sachenko, A. V., Kostylov, V. P., Lytovchenko, V. H., Popov, V. H., Romaniuk, B. M., Chernenko, V. V., . . . Komarov, F. F. (2013). Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer.
Chicago Style (17th ed.) CitationSachenko, A. V., et al. Recombination Characteristics of Single-crystalline Silicon Wafers with a Damaged Near-surface Layer. 2013.
MLA (8th ed.) CitationSachenko, A. V., et al. Recombination Characteristics of Single-crystalline Silicon Wafers with a Damaged Near-surface Layer. 2013.
Warning: These citations may not always be 100% accurate.