Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
Збережено в:
| Дата: | 2013 |
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| Автори: | , , , , , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2013
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| Назва видання: | Ukrainian Journal of Physics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000725395 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859541070019297280 |
|---|---|
| author | A. V. Sachenko V. P. Kostylov V. H. Lytovchenko V. H. Popov B. M. Romaniuk V. V. Chernenko V. M. Nasieka T. V. Slusar S. I. Kyrylova F. F. Komarov |
| author_facet | A. V. Sachenko V. P. Kostylov V. H. Lytovchenko V. H. Popov B. M. Romaniuk V. V. Chernenko V. M. Nasieka T. V. Slusar S. I. Kyrylova F. F. Komarov |
| author_sort | A. V. Sachenko |
| collection | Open-Science |
| first_indexed | 2025-07-22T11:14:56Z |
| format | Article |
| id | open-sciencenbuvgovua-87302 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T11:14:56Z |
| publishDate | 2013 |
| record_format | dspace |
| series | Ukrainian Journal of Physics |
| spelling | open-sciencenbuvgovua-873022024-04-16T18:57:17Z Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer A. V. Sachenko V. P. Kostylov V. H. Lytovchenko V. H. Popov B. M. Romaniuk V. V. Chernenko V. M. Nasieka T. V. Slusar S. I. Kyrylova F. F. Komarov 0372-400X 2013 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0000725395 Article |
| spellingShingle | Ukrainian Journal of Physics A. V. Sachenko V. P. Kostylov V. H. Lytovchenko V. H. Popov B. M. Romaniuk V. V. Chernenko V. M. Nasieka T. V. Slusar S. I. Kyrylova F. F. Komarov Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title | Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_full | Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_fullStr | Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_full_unstemmed | Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_short | Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_sort | recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000725395 |
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