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Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

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Bibliographic Details
Main Authors: A. V. Sachenko, V. P. Kostylov, V. H. Lytovchenko, V. H. Popov, B. M. Romaniuk, V. V. Chernenko, V. M. Nasieka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Format: Article
Language:English
Published: 2013
Series:Ukrainian Journal of Physics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000725395
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Internet

http://jnas.nbuv.gov.ua/article/UJRN-0000725395

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