Cover Image

Deformation potential constants Ξu and Ξd in n-Si determined with the use of the tensoresistance effect

Saved in:

Bibliographic Details
Date:	2012
Main Authors:	S. V. Luniov, L. I. Panasiuk, S. A. Fedosov
Format:	Article
Language:	English
Published:	2012
Series:	Ukrainian journal of physics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000678455
Tags:	Add Tag No Tags, Be the first to tag this record!
Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

Institution

Library portal of National Academy of Sciences of Ukraine | LibNAS

Similar Items

Deformation potential constants Ξu and Ξd in n-Si determined with the use of the tensoresistance effect
by: S. V. Lunov, et al.
Published: (2012)

Characterizations of additive ξ-Lie derivations on unital algebras
by: M. Ashraf, et al.
Published: (2021)

On the Distribution of the Number of Calls in the Queuing System $D_{η}|D_{ξ}^{\kappa}|1$
by: Yezhov, I. I., et al.
Published: (2000)

Diffuse interstellar bands towards ο Per and ξ Per
by: Debudej, A., et al.
Published: (2012)

Hyers-Ulam Stability of Ternary (σ, t, ξ)-Derivations on C*-Ternary Algebras
by: Gordji, M.E., et al.
Published: (2012)

On the methodology of tensoresistance determination for n-Ge and n-Si in the crystallographic directions 〈110〉
by: H. P. Haidar
Published: (2019)

Dose dependence of tensoresistance for the symmetrical orientation of the deformation axis relatively to all isoenergetic ellipsoids in γ-irradiated (⁶⁰Co) n-Si crystals
by: Gaidar, G.P.
Published: (2018)

Tensoresistive effect in the system of potential barriers in semiconductor films
by: G. Guljamov, et al.
Published: (2013)

On the methodology of determining the transverse tensoresistance in multi-valley semiconductors
by: H. P. Haidar
Published: (2022)

Dose dependence of tensoresistance for the symmetrical orientation of the deformation axis relatively to all isoenergetic ellipsoids in γ-irradiated (60Co) n-Si crystals
by: G. P. Gaidar
Published: (2018)

Tensoresistance of amorphous ferromagnetics
by: M. P. Semenko, et al.
Published: (2009)

Features of tensoresistive properties of thin metallic films under elastic and plastic deformations
by: D. V. Velykodnyi, et al.
Published: (2011)

The Effect of Constant Negative Bias Potential on the Structure, Substructure and Stressedly Deformed State of the TiN Coatings
by: O. V. Sobol, et al.
Published: (2013)

Errata: The Effect of Constant Negative Bias Potential on the Structure, Substructure and Stressedly Deformed State of the TiN Coatings
by: O. V. Sobol, et al.
Published: (2013)

Tensoresistivity properties of film materials base on Ni and Mo or Cr
by: I. P. Buryk, et al.
Published: (2009)

Features of tensoresistance in single crystals of germanium and silicon with different dopants
by: Baranskii, P.I., et al.
Published: (2016)

Features of tensoresistance in single crystals of germanium and silicon with different dopants
by: P. I. Baranskii, et al.
Published: (2016)

Representations of U(2∞) and the Value of the Fine Structure Constant
by: Klink, W.H.
Published: (2005)

u-Deformed WZW model and its gauging
by: Klimčík, C.
Published: (2006)

On Murnaghan&#039;s Constants of Nonlinear Hyperelastic Deformation of Materials
by: Ja. Ja. Rushchitskij
Published: (2016)

Mechanisms of electron scattering in uniaxially deformed n-Ge‹Sb, Au› single crystals
by: Luniov, S.V., et al.
Published: (2019)

The method of shear modulus determination for n-Ge and n-Si single crystals
by: V. I. Shvabiuk, et al.
Published: (2017)

Some peculiarities of thermopower anisotropy in undeformed and elastically deformed n – Si and n – Ge single crystals
by: G. P. Gaidar, et al.
Published: (2015)

Influence of thermoannealings at 450 and 650 oC on the tensoresistance and anisotropy parameter in mobility of silicon single crystals
by: P. I. Baranskyi, et al.
Published: (2014)

Exponential smoothing constant determination to minimize the forecast error
by: N. A.M. Noor, et al.
Published: (2022)

Fundamental Physical Constants and their Stability, Transition to New Definitions of the SI Units
by: Melnikov, V. N., et al.
Published: (2012)

Morphology and optical constants of ge nanocrystalline films deposited on Si(001)
by: Yu. M. Kozyriev, et al.
Published: (2016)

Determination of the ²³⁴U isotope content in uranium-bearing materials using high-resolution gamma spectrometry
by: Kutniy, D.V., et al.
Published: (2021)

Matrix Spherical Functions for (SU(𝑛 + 𝑚), S(U(𝑛) × U(𝑚))) : Two Specific Classes
by: Liu, Jie
Published: (2023)

The Maxwell modified method of determination of effective constants of heterogeneous materials
by: V. I. Kushch, et al.
Published: (2017)

Determination of fundamental optical constants of Zn₂SnO₄ films
by: Salohub, A.O., et al.
Published: (2017)

Influence of the magnitude of the bias potential and thickness of the layers on the structure, substructure, stress-deformed state and mechanical characteristics of vacuum-arc multi-layered (TiMo)N/(TiSi)N coatings
by: Sobol, O.V., et al.
Published: (2020)

Cyclotron U-240 trim coil currents determination
by: A. E. Valkov, et al.
Published: (2013)

Cyclotron U-240 trim coil currents determination
by: A. E. Valkov, et al.
Published: (2012)

Determination of the activation energy of A-center in the uniaxially deformed n-Ge single crystals
by: S. V. Lunov, et al.
Published: (2017)

Ð’Ð¿Ð»Ð¸Ð² Ñ€Ñ–Ð²Ð½Ñ Ð²Ð¾Ð»Ð¾Ð³Ð¾ÑÑ‚Ñ– Ð³ÐµÑ€Ð¼Ð¿Ð»Ð°Ð·Ð¼Ð¸ Ð²Ð¸Ð½Ð¾Ð³Ñ€Ð°Ð´Ñƒ Ð½Ð° Ñ—Ñ— Ð¶Ð¸Ñ‚Ñ‚Ñ”Ð·Ð´Ð°Ñ‚Ð½Ñ–ÑÑ‚ÑŒ Ð¿Ñ–ÑÐ»Ñ Ñ€Ñ–Ð·Ð½Ð¸Ñ… ÑÐ¿Ð¾ÑÐ¾Ð±Ñ–Ð² Ñ– Ñ‚ÐµÑ€Ð¼Ñ–Ð½Ñ–Ð² Ð³Ñ–Ð¿Ð¾Ñ‚ÐµÑ€Ð¼Ñ–Ñ‡Ð½Ð¾Ð³Ð¾ Ð·Ð±ÐµÑ€Ñ–Ð³Ð°Ð½Ð½Ñ
by: Prystalov, Anton I.
Published: (2017)

Ð—Ð¼Ñ–Ð½Ð° Ð¾ÑÐ¼Ð¾Ñ‚Ð¸Ñ‡Ð½Ð¾Ñ— ÐºÑ€Ð¸Ñ…ÐºÐ¾ÑÑ‚Ñ– Ñ‚Ð° Ñ–Ð½Ð´ÐµÐºÑÑƒ ÑÑ„ÐµÑ€Ð¸Ñ‡Ð½Ð¾ÑÑ‚Ñ– ÐµÑ€Ð¸Ñ‚Ñ€Ð¾Ñ†Ð¸Ñ‚Ñ–Ð² Ñ‰ÑƒÑ€Ñ–Ð² Ñ€Ñ–Ð·Ð½Ð¾Ð³Ð¾ Ð²Ñ–ÐºÑƒ Ð¿Ñ–ÑÐ»Ñ Ñ…Ð¾Ð»Ð¾Ð´Ð¾Ð²Ð¸Ñ… Ð²Ð¿Ð»Ð¸Ð²Ñ–Ð²
by: Ostras, Daniil A., et al.
Published: (2019)

Ð—Ð´Ð°Ñ‚Ð½Ñ–ÑÑ‚ÑŒ Ñ€Ñ–Ð·Ð½Ð¸Ñ… Ð·Ð° Ð²Ñ–ÐºÐ¾Ð¼ ÐµÑ€Ð¸Ñ‚Ñ€Ð¾Ñ†Ð¸Ñ‚Ñ–Ð² Ð´Ð¾ ÐºÐ¸ÑÐ»Ð¾Ñ€Ð¾Ð´-Ñ‚Ñ€Ð°Ð½ÑÐ¿Ð¾Ñ€Ñ‚Ð½Ð¾Ñ— Ñ„ÑƒÐ½ÐºÑ†Ñ–Ñ— Ñ‚Ð° Ð·Ð¼Ñ–Ð½Ð° Ñ—Ñ… Ð¶Ð¾Ñ€ÑÑ‚ÐºÐ¾ÑÑ‚Ñ– Ñƒ Ð¿Ñ€Ð¾Ñ†ÐµÑÑ– Ð³Ñ–Ð¿Ð¾Ñ‚ÐµÑ€Ð¼Ñ–Ñ‡Ð½Ð¾Ð³Ð¾ Ð·Ð±ÐµÑ€Ñ–Ð³Ð°Ð½Ð½Ñ
by: Mykhailova, Olga O., et al.
Published: (2019)

Ð–Ð¸Ñ‚Ñ‚Ñ”Ð·Ð´Ð°Ñ‚Ð½Ñ–ÑÑ‚ÑŒ ÐºÑ€Ñ–Ð¾ÐºÐ¾Ð½ÑÐµÑ€Ð²Ð¾Ð²Ð°Ð½Ð¸Ñ… Ð¿Ñ€Ð¾Ð±Ñ–Ð¾Ñ‚Ð¸Ñ‡Ð½Ð¸Ñ… ÑˆÑ‚Ð°Ð¼Ñ–Ð² Ð¼Ñ–ÐºÑ€Ð¾Ð¾Ñ€Ð³Ð°Ð½Ñ–Ð·Ð¼Ñ–Ð², Ñ–Ð¼Ð¼Ð¾Ð±Ñ–Ð»Ñ–Ð·Ð¾Ð²Ð°Ð½Ð¸Ñ… Ð² Ð°Ð»ÑŒÐ³Ñ–Ð½Ð°Ñ‚Ð½Ð¾Ð¼Ñƒ Ð³ÐµÐ»Ñ– Ð· Ð´Ð¾Ð´Ð°Ð²Ð°Ð½Ð½ÑÐ¼ Ñ€Ñ–Ð·Ð½Ð¸Ñ… ÐºÐ¾Ð½Ñ†ÐµÐ½Ñ‚Ñ€Ð°Ñ†Ñ–Ð¹ Ð´Ð¸ÑÐ°Ñ…Ð°Ñ€Ð¸Ð´Ñ–Ð²
by: Petrov, Illia V., et al.
Published: (2019)

ÐžÐ±Ñ€Ð¾Ð±ÐºÐ° Ð¿Ð¾Ð²ÐµÑ€Ñ…Ð½Ñ– Ð¾Ñ€Ñ‚Ð¾Ð¿ÐµÐ´Ð¸Ñ‡Ð½Ð¸Ñ… Ñ–Ð¼Ð¿Ð»Ð°Ð½Ñ‚Ð°Ñ‚Ñ–Ð² ÐºÐ¾Ð¼Ð¿Ð¾Ð·Ð¸Ñ†Ñ–Ñ”ÑŽ Ð½Ð° Ð¾ÑÐ½Ð¾Ð²Ñ– ÑÐ¸Ñ€Ð¾Ð²Ð°Ñ‚ÐºÐ¸ ÐºÑ€Ð¾Ð²Ñ– Ð¿Ð¾Ð»Ñ–Ð¿ÑˆÑƒÑ” Ñ—Ñ… Ð±Ñ–Ð¾ÑÑƒÐ¼Ñ–ÑÐ½Ñ–ÑÑ‚ÑŒ
by: Lazarenko, G. O., et al.
Published: (2018)