Khodakovskij, N. I., Larkin, J., & Galstjan, G. G. (2011). Study of probe methods for fabrication of units for nanoelectronic devices and diagnostic technique using electrostatic force microscopy.
Chicago-Zitierstil (17. Ausg.)Khodakovskij, N. I., Ju Larkin, und G. G. Galstjan. Study of Probe Methods for Fabrication of Units for Nanoelectronic Devices and Diagnostic Technique Using Electrostatic Force Microscopy. 2011.
MLA-Zitierstil (8. Ausg.)Khodakovskij, N. I., et al. Study of Probe Methods for Fabrication of Units for Nanoelectronic Devices and Diagnostic Technique Using Electrostatic Force Microscopy. 2011.
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