Вплив олова на структурнi перетворення тонкоплiвкової субоксидної матрицi кремнiю

• Date: 2019
• Main Authors: Voitovych, V. V., Rudenko, R. M., Yuchymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. G., Povarchuk, V. Yu., Khachevich, I. M., Rudenko, M. P.
• Format: Article
• Language: English; Ukrainian
• Published: Publishing house "Academperiodika" 2019
• Subjects: кристалiзацiя; аморфний кремнiй; олово; кристалiти кремнiю нанорозмiрiв
• Online Access: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019014
• Journal Title: Ukrainian Journal of Physics

The processes of crystallization of amorphous silicon (a-Si) in the a-SiOxSn (1 ≤ x ≤ 2) sub-oxide matrix have been studied. The temperature, at which the crystallization begins, is shown to be lower for a-SiOxSn films with higher tin contents. For specimens with the maximum tin content (about 2 vol...