Комбiнацiйне розсiювання свiтла в процесi iндукованої оловом кристалiзацiї аморфного кремнiю
Metal-induced crystallization in Si–Sn–Si thin film structures has been studied, by using the Raman scattering at various light powers. The Raman spectra are used to monitor the temperature, size, and concentration of Si crystals formed in the amorphous Si matrix. A significant acceleration of the m...
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| Date: | 2019 |
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| Main Authors: | , , , , , , |
| Format: | Article |
| Language: | English Ukrainian |
| Published: |
Publishing house "Academperiodika"
2019
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| Subjects: | |
| Online Access: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019115 |
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| Journal Title: | Ukrainian Journal of Physics |
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Ukrainian Journal of Physics| Summary: | Metal-induced crystallization in Si–Sn–Si thin film structures has been studied, by using the Raman scattering at various light powers. The Raman spectra are used to monitor the temperature, size, and concentration of Si crystals formed in the amorphous Si matrix. A significant acceleration of the metal-induced crystallization in Si–Sn–Si structures at their laser-assisted annealing in comparison with their annealing in dark is revealed. A basic possibility of the “on line” monitoring of the size and the concentration of Si nanocrystals in the course of their formation is demonstrated. |
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