Оптичні та електричні властивості Tb–ZnO/SiO2 в ІЧ-області спектра
Optical and electrophysical properties of terbium-doped zinc oxide films have been studied, by using the external reflection IR spectroscopy. The films were deposited onto silicon oxide substrates with the help of the magnetron sputtering method. A theoretical analysis of the reflection spectra of t...
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| Datum: | 2019 |
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| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | English Ukrainian |
| Veröffentlicht: |
Publishing house "Academperiodika"
2019
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| Schlagworte: | |
| Online Zugang: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019335 |
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| Назва журналу: | Ukrainian Journal of Physics |