Enhanced 2D plotting method for scanning probe microscopy imaging by Beketov, G.V.

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Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy by Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.

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AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers by Beketov, G.V., Rashkovetskiy, L.V., Rengevych, O.V., Zhovnir, G.I.

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Trap-assisted conductivity in anodic oxide on InSb by Beketov, G.V., Sukach, A.V., Tetyorkin, V.V., Trotsenko, S.P.

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Особливостi дислокацiйного поглинання ультразвуку в безсубблочних кристалах Cd0,2Hg0,8Te by Lysyuk, I. O., Olikh, Ya. M., Olikh, O. Ya., Beketov, G V.

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Refractory contact to a-SiC produced by laser technology methods by Fedorenko, L.L., Kiseleov, V.S., Svechnikov, S.V., Yusupov, M.M., Beketov, G.V.

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Biochemical passivation of metal surfaces for sensor application: reactive annealing of polycrystalline gold films in hydrogen sulfide atmosphere by Snopok, B. A., Kostyukevych, K.V., Beketov, G.V., Zinio, S.A., Shirshov, Yu.M., Venger, E.F.

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Hot wall growth and properties of lead telluride films doped by germanium and gallium by Lashkarev, G.V., Radchenko, M.V., Slynko, E.I., Vodopiyanov, V.N., Asotsky, V.V., Kaminsky, V.M., Beketov, G.V., Rengevich, E.V.

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