Харвестер відкритої науки НАН України

Enhanced 2D plotting method for scanning probe microscopy imaging

von Beketov, G.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)

Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy

von Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)

AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers

von Beketov, G.V., Rashkovetskiy, L.V., Rengevych, O.V., Zhovnir, G.I.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Особливостi дислокацiйного поглинання ультразвуку в безсубблочних кристалах Cd0,2Hg0,8Te

von Lysyuk, I. O., Olikh, Ya. M., Olikh, O. Ya., Beketov, G V.
Veröffentlicht 2018

Refractory contact to a-SiC produced by laser technology methods

von Fedorenko, L.L., Kiseleov, V.S., Svechnikov, S.V., Yusupov, M.M., Beketov, G.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)

Biochemical passivation of metal surfaces for sensor application: reactive annealing of polycrystalline gold films in hydrogen sulfide atmosphere

von Snopok, B. A., Kostyukevych, K.V., Beketov, G.V., Zinio, S.A., Shirshov, Yu.M., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Hot wall growth and properties of lead telluride films doped by germanium and gallium

von Lashkarev, G.V., Radchenko, M.V., Slynko, E.I., Vodopiyanov, V.N., Asotsky, V.V., Kaminsky, V.M., Beketov, G.V., Rengevich, E.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)