Enhanced 2D plotting method for scanning probe microscopy imaging von Beketov, G.V.

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Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy von Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.

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AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers von Beketov, G.V., Rashkovetskiy, L.V., Rengevych, O.V., Zhovnir, G.I.

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Trap-assisted conductivity in anodic oxide on InSb von Beketov, G.V., Sukach, A.V., Tetyorkin, V.V., Trotsenko, S.P.

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Особливостi дислокацiйного поглинання ультразвуку в безсубблочних кристалах Cd0,2Hg0,8Te von Lysyuk, I. O., Olikh, Ya. M., Olikh, O. Ya., Beketov, G V.

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Refractory contact to a-SiC produced by laser technology methods von Fedorenko, L.L., Kiseleov, V.S., Svechnikov, S.V., Yusupov, M.M., Beketov, G.V.

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Biochemical passivation of metal surfaces for sensor application: reactive annealing of polycrystalline gold films in hydrogen sulfide atmosphere von Snopok, B. A., Kostyukevych, K.V., Beketov, G.V., Zinio, S.A., Shirshov, Yu.M., Venger, E.F.

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Hot wall growth and properties of lead telluride films doped by germanium and gallium von Lashkarev, G.V., Radchenko, M.V., Slynko, E.I., Vodopiyanov, V.N., Asotsky, V.V., Kaminsky, V.M., Beketov, G.V., Rengevich, E.V.

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