Dependence of the defect introduction rate on the dose of irradiation of p-Si by fast-pile neutrons

by Dolgolenko, A.P., Varentsov, M.D., Gaidar, G.P., Litovchenko, P.G.
Published 2007

Peculiarities of charge carriers transport in submicron Si-Ge whiskers

by Druzhinin, A.A., Dolgolenko, A.P., Ostrovskii, I.P., Khoverko, Yu.N., Nichkalo, S.I., Kogut, Iu.R.
Published 2014

Seebeck’s effect in p-SiGe whisker samples

by Dolgolenko, A.P., Druzhinin, A.A., Karpenko, A.Ya., Nichkalo, S.I., Ostrovsky, I.P., Litovchenko, P.G., Litovchenko, A.P.
Published 2011