Search Results - E. Mukhtarov

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    A non-destructive method for measuring the depth of occurrence of the p-n junction of semiconductor photoelectric structures by R. Aliev, E. Mukhtarov, L. Olimov

    Published 2010
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    The process of forming the polycrystalline silicon wafer from the powder raw material and analyzing the impurity composition of their surface by R. Aliev, L. Olimov, E. Mukhtarov, Zh. Alieva

    Published 2011
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