Search Results - Klyui, N. I.
- Showing 1 - 12 results of 12
-
1
-
2
-
3
-
4
-
5
-
6
-
7
-
8
-
9
High efficient solar cells and modules based on diamond-like carbon film - multicrystalline Si structures by Klyui, N.I., Korneta, O.B., Kostylyov, V.P., Litovchenko, V.G., Makarov, A.V., Dikusha, V.N., Neselevska, L.V., Gorbulik, V.I.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)Get full text
Article -
10
Micro-Raman study of CNx composites subjected to high pressure treatment by Klyui, N.I., Valakh, M.Ya., Visotski, V.G., Pascual, J., Mestres, N., Novikov, N.V., Petrusha, I.A., Voronkin, M.A., Zaika, N.I.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)Get full text
Article -
11
Optical and morphological properties of tetragonal Cu₂ZnSnS₄ thin films grown from sulphide precursors at lower temperatures by Babichuk, I.S., Yukhymchuk, V.O., Semenenko, M.O., Klyui, N.I., Caballero, R., Hreshchuk, O.M., Lemishko, L.S., Babichuk, L.V., Ganus, V.O., Leon, M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)Get full text
Article -
12
Search Tools:
Related Subjects
-
Characterization and properties
81.40.Tv
Czochralski technique
PACS 78.30.Fs
broadening parameter
degradation stability of crystals
electroreflectance
epitaxial film
gallium nitride
internal mechanical stresses
internal strain
microwave treatment
внутрiшнi механiчнi напруження
внутрiшня деформацiя
деградацiйна стiйкiсть кристалiв
електровiдбивання
епiтаксiйна плiвка
мiкрохвильова обробка
метод Чохральського
нiтрид галiю
параметр уширення