Optimization of bromine-emerging etching compositions K₂Cr₂O₇-HBr-ethylene glycol for forming a polished surface of CdTe, ZnxCd₁-xTe and CdxHg₁-xTe by Chayka, M.V., Tomashyk, Z.F., Tomashyk, V.M., Malanych, G.P., Korchovyi, A.A.

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Chemical polishing of InAs, InSb, GaAs and GaSb by Levchenko, I.V., Tomashyk, V.M., Stratiychuk, I.B., Malanych, G.P., Stanetska, A.S., Korchovyi, A.A.

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Chemical-dynamic polishing of InAs, InSb, GaAs and GaSb crystals with (NH₄)₂Cr₂O₇-HBr-citric acid etching composition by Levchenko, I.V., Tomashyk, V.M., Stratiychuk, I.B., Malanych, G.P., Stanetska, A.S., Korchovyi, A.A.

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Investigation of superlattice structure parameters using quasi-forbidden reflections by Kladko, V.P., Datsenko, L.I., Korchovyi, A.A., Machulin, V.F., Lytvyn, P.M., Shalimov, A.V., Kuchuk, A.V., Kogutyuk, P.P.

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Structure and optical properties of AlN films obtained using the cathodic arc plasma deposition technique by Shapovalov, A.P., Korotash, I.V., Rudenko, E.M., Sizov, F.F., Dubyna, D.S., Osipov, L.S., Polotskiy, D.Yu., Tsybrii, Z.F., Korchovyi, A.A.

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Nanopatterning Au chips for SPR refractometer by using interference lithography and chalcogenide photoresist by Dan’ko, V.A., Dorozinsky, G.V., Indutnyi, I.Z., Myn’ko, V.I., Ushenin, Yu.V., Shepeliavyi, P.E., Lukaniuk, M.V., Korchovyi, A.A., Khrystosenko, R.V.

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Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics by Vashchenko, V.A., Yatsenko, I.V., Kovalenko, Yu.I., Kladko, V.P., Gudymenko, O.Yo., Lytvyn, P.M., Korchovyi, A.A., Mamykin, S.V., Kondratenko, O.S., Maslov, V.P., Dorozinska, H.V., Dorozinsky, G.V.

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The influence of substrate temperature on properties of Cu-Al-O films deposited using the reactive ion beam sputtering method by Ievtushenko, A.I., Dusheyko, M.G., Karpyna, V.A., Bykov, O.I., Lytvyn, P.M., Olifan, O.I., Levchenko, V.A., Korchovyi, A.A., Starik, S.P., Tkach, S.V., Kuzmenko, E.F., Lashkarev, G.V.

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