Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si

за авторством M. M. Krasko
Опубліковано 2013

Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si

за авторством M. M. Krasko
Опубліковано 2013

Influence of tin impurity on recombination characteristics in γ-irradiated n-Si

за авторством M. M. Krasko
Опубліковано 2012

Influence of tin impurity on recombination characteristics in γ-irradiated n-Si

за авторством M. M. Krasko
Опубліковано 2012

Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing

за авторством M. M. Krasko, A. H. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rohutskyi
Опубліковано 2018

Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing

за авторством M. M. Krasko, A. G. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rogutskyi
Опубліковано 2018

Influence of г-irradiation on initial magnetic permeability of amorphous and nanocrystalline Fe−Si−B-based alloys

за авторством Yu. Povarchuk, V. K. Nosenko, A. M. Kraichynskyi, V. B. Neimash, M. M. Krasko, V. V. Maslov
Опубліковано 2012

Influence of г-irradiation on initial magnetic permeability of amorphous and nanocrystalline Fe−Si−B-based alloys

за авторством Yu. Povarchuk, V. K. Nosenko, A. M. Kraitchinskii, V. B. Neimash, M. M. Krasko, V. V. Maslov
Опубліковано 2012

Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin

за авторством R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara
Опубліковано 2013

Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin

за авторством R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara
Опубліковано 2013

Formation of nanocrystalline silicon in tin-doped amorphous silicon films

за авторством R. M. Rudenko, O. O. Voitsikhovska, V. V. Voitovych, A. H. Kolosiuk, M. M. Krasko, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok
Опубліковано 2020

Formation of nanocrystalline silicon in tin-doped amorphous silicon films

за авторством R. M. Rudenko, O. O. Voitsihovska, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok
Опубліковано 2020

Effect of tin on structural transformations in the thin-film silicon suboxide matrix

за авторством V. V. Voitovych, R. M. Rudenko, V. O. Yuchymchuk, M. V. Voitovych, M. M. Krasko, A. G. Kolosiuk, Yu. Povarchuk, I. M. Khachevich, M. P. Rudenko
Опубліковано 2016

Effect of tin on structural transformations in the thin-film silicon suboxide matrix

за авторством V. V. Voitovych, R. M. Rudenko, V. O. Yukhymchuk, M. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, Yu. Povarchuk, I. M. Khatsevych, M. P. Rudenko
Опубліковано 2016

Behavior of hydrogen during crystallization of thin silicon films doped with tin

за авторством R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. H. Kolosiuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuk, M. V. Voitovych, Ya. Bratus, I. A. Zaloilo
Опубліковано 2013

Behavior of hydrogen during crystallization of thin silicon films doped with tin

за авторством R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. G. Kolosyuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuck, Ya. Bratus, M. V. Voitovych, I. A. Zaloilo
Опубліковано 2013