Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si von M. M. Krasko

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Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si von M. M. Krasko

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Influence of tin impurity on recombination characteristics in γ-irradiated n-Si von M. M. Krasko

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Influence of tin impurity on recombination characteristics in γ-irradiated n-Si von M. M. Krasko

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Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing von M. M. Krasko, A. H. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rohutskyi

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Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing von M. M. Krasko, A. G. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rogutskyi

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Influence of г-irradiation on initial magnetic permeability of amorphous and nanocrystalline Fe−Si−B-based alloys von Yu. Povarchuk, V. K. Nosenko, A. M. Kraitchinskii, V. B. Neimash, M. M. Krasko, V. V. Maslov

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Influence of г-irradiation on initial magnetic permeability of amorphous and nanocrystalline Fe−Si−B-based alloys von Yu. Povarchuk, V. K. Nosenko, A. M. Kraichynskyi, V. B. Neimash, M. M. Krasko, V. V. Maslov

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Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin von R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara

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Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin von R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara

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Formation of nanocrystalline silicon in tin-doped amorphous silicon films von R. M. Rudenko, O. O. Voitsikhovska, V. V. Voitovych, A. H. Kolosiuk, M. M. Krasko, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok

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Formation of nanocrystalline silicon in tin-doped amorphous silicon films von R. M. Rudenko, O. O. Voitsihovska, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok

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Effect of tin on structural transformations in the thin-film silicon suboxide matrix von V. V. Voitovych, R. M. Rudenko, V. O. Yuchymchuk, M. V. Voitovych, M. M. Krasko, A. G. Kolosiuk, Yu. Povarchuk, I. M. Khachevich, M. P. Rudenko

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Effect of tin on structural transformations in the thin-film silicon suboxide matrix von V. V. Voitovych, R. M. Rudenko, V. O. Yukhymchuk, M. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, Yu. Povarchuk, I. M. Khatsevych, M. P. Rudenko

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Behavior of hydrogen during crystallization of thin silicon films doped with tin von R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. G. Kolosyuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuck, Ya. Bratus, M. V. Voitovych, I. A. Zaloilo

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Behavior of hydrogen during crystallization of thin silicon films doped with tin von R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. H. Kolosiuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuk, M. V. Voitovych, Ya. Bratus, I. A. Zaloilo

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