Search Results - M. M. Krasko

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  1. 1
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    Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si by M. M. Krasko

    Published 2013
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  2. 2
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    Influence of tin impurity on degradation of conductivity in electron-irradiated n-Si by M. M. Krasko

    Published 2013
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  3. 3
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    Influence of tin impurity on recombination characteristics in γ-irradiated n-Si by M. M. Krasko

    Published 2012
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  4. 4
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    Influence of tin impurity on recombination characteristics in γ-irradiated n-Si by M. M. Krasko

    Published 2012
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  5. 5
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    Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing by M. M. Krasko, A. H. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rohutskyi

    Published 2018
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  6. 6
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    Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing by M. M. Krasko, A. G. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rogutskyi

    Published 2018
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  7. 7
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    Influence of г-irradiation on initial magnetic permeability of amorphous and nanocrystalline Fe−Si−B-based alloys by Yu. Povarchuk, V. K. Nosenko, A. M. Kraitchinskii, V. B. Neimash, M. M. Krasko, V. V. Maslov

    Published 2012
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  8. 8
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    Influence of г-irradiation on initial magnetic permeability of amorphous and nanocrystalline Fe−Si−B-based alloys by Yu. Povarchuk, V. K. Nosenko, A. M. Kraichynskyi, V. B. Neimash, M. M. Krasko, V. V. Maslov

    Published 2012
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  9. 9
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    Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin by R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara

    Published 2013
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  10. 10
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    Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin by R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara

    Published 2013
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  11. 11
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    Formation of nanocrystalline silicon in tin-doped amorphous silicon films by R. M. Rudenko, O. O. Voitsikhovska, V. V. Voitovych, A. H. Kolosiuk, M. M. Krasko, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok

    Published 2020
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  12. 12
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    Formation of nanocrystalline silicon in tin-doped amorphous silicon films by R. M. Rudenko, O. O. Voitsihovska, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok

    Published 2020
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  13. 13
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    Effect of tin on structural transformations in the thin-film silicon suboxide matrix by V. V. Voitovych, R. M. Rudenko, V. O. Yuchymchuk, M. V. Voitovych, M. M. Krasko, A. G. Kolosiuk, Yu. Povarchuk, I. M. Khachevich, M. P. Rudenko

    Published 2016
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  14. 14
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    Effect of tin on structural transformations in the thin-film silicon suboxide matrix by V. V. Voitovych, R. M. Rudenko, V. O. Yukhymchuk, M. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, Yu. Povarchuk, I. M. Khatsevych, M. P. Rudenko

    Published 2016
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  15. 15
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    Behavior of hydrogen during crystallization of thin silicon films doped with tin by R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. G. Kolosyuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuck, Ya. Bratus, M. V. Voitovych, I. A. Zaloilo

    Published 2013
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  16. 16
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    Behavior of hydrogen during crystallization of thin silicon films doped with tin by R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. H. Kolosiuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuk, M. V. Voitovych, Ya. Bratus, I. A. Zaloilo

    Published 2013
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