Search Results - Makara, V. A.
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Effect of a weak constant magnetic field on the silicon single crystal structure by Makara, V.A., Kalinichenko, D.V.
Published in Functional Materials (2011)Get full text
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A theoretical model for calculation of biphase composite failure energy by Popov, A.Yu., Kazo, I.F., Makara, V.A.
Published in Functional Materials (2005)Get full text
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Calculation of fracture toughness for a biphase ceramic material by Popov, O.Yu., Kazo, I.F., Makara, V.A.
Published in Functional Materials (2006)Get full text
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Електронні властивості поверхні (111) в А3В5 та А2В6 кристалах by Gorkavenko, T.V., Zubkova, S.M., Makara, V.A., Rusina, L.N., Smelyansky, O.V.
Published 2022
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Effect of magnetic field on microhardness of germanium by Makara, V.A., Steblenko, L.P., Kuryliuk, A.M., Naumenko, S.M., Kolchenko, Iu.L., Kravchenko, V.M.
Published in Functional Materials (2007)Get full text
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Comprehensive studies of defect production and strained states in silicon epitaxial layers and device structures based on them by Boltovets, N.S., Voitsikhovskyi, D.I., Konakova, R.V., Milenin, V.V., Makara, V.A., Rudenko, O.V., Mel’nichenko, M.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)Get full text
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Effect of weak magnetic field on structural arrangement of extrinsic oxygen atoms and mechanical properties of silicon monocrystals by Makara, V.A., Steblenko, L.P., Kolchenko, Yu.L., Naumenko, S.M., Lisovsky, I.P., Mazunov, D.O., Mokliak, Yu.Yu.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)Get full text
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Magnetic-Field-Stimulated Modification of Surface Charge and Defect Content in Silicon for Solar Energy Storage by Makara, V.A., Steblenko, L.P., Korotchenkov, O.A., Nadtochiy, A.B., Kalinichenko, D.V., Kuryliuk, A.M., Kobzar, Yu.L., Krit, O.M.
Published in Металлофизика и новейшие технологии (2014)Get full text
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Related Subjects
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Characterization and properties
Auger method
Microstructure of thin composite films
Raman spectroscopy
crystallization
doping with tin
ellipsometry
homogeneity control
isochronal annealing
iзохронний вiдпал
methods of measuring the film parameters
optical band gap
thin-film silicon
Дефекты кристаллической решётки
контроль однородности
кристалiзацiя
легування оловом
мiкроструктура тонких композитних плiвок
метод Оже
метод раманiвської спектроскопiї
методы измерения параметров пленок
оптична заборонена зона
тонкоплiвковий кремнiй
эллипсометрия