Investigation of the undersurface damaged layers in silicon wafers by Holiney, R.Yu., Matveeva, L.A., Venger, E.F.

Get full text

Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation by Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.

Get full text

Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it by Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.

Get full text

Получение, свойства и применение тонких нанонеоднородных пленок Ge на GaAs-подложках by Venger, E. F., Lytvyn, P. M., Matveeva, L. A., Mitin, V. F., Kholevchuk, V. V.

Get full text

The features of structural-impurity ordering of interfaces in Ta₂O₅-p-Si heterostructures (exposed to microwave pretreatment and aging) induced by further microwave treatment by Kolyadina, E.Yu., Konakova, R.V., Matveeva, L.A., Mitin, V.F., Shynkarenko, V.V., Atanassova, E.

Get full text

Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments by Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.

Get full text

Ordering of lateral nonuniformity of TiBx film and transition layer in the TiBx-GaAs system by Konakova, R.V., Milenin, V.V., Voitsikhovskyi, D.I., Kamalov, A.B., Kolyadina, E.Yu., Lytvyn, P.M., Lytvyn, O.S., Matveeva, L.A., Prokopenko, I.V.

Get full text

Influence of neutron irradiation on elctrooptical and structural properties of silicon by Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.

Get full text