Investigation of the undersurface damaged layers in silicon wafers von Holiney, R.Yu., Matveeva, L.A., Venger, E.F.

Volltext

Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation von Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.

Volltext

Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it von Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.

Volltext

Получение, свойства и применение тонких нанонеоднородных пленок Ge на GaAs-подложках von Venger, E. F., Lytvyn, P. M., Matveeva, L. A., Mitin, V. F., Kholevchuk, V. V.

Volltext

The features of structural-impurity ordering of interfaces in Ta₂O₅-p-Si heterostructures (exposed to microwave pretreatment and aging) induced by further microwave treatment von Kolyadina, E.Yu., Konakova, R.V., Matveeva, L.A., Mitin, V.F., Shynkarenko, V.V., Atanassova, E.

Volltext

Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments von Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.

Volltext

Ordering of lateral nonuniformity of TiBx film and transition layer in the TiBx-GaAs system von Konakova, R.V., Milenin, V.V., Voitsikhovskyi, D.I., Kamalov, A.B., Kolyadina, E.Yu., Lytvyn, P.M., Lytvyn, O.S., Matveeva, L.A., Prokopenko, I.V.

Volltext

Influence of neutron irradiation on elctrooptical and structural properties of silicon von Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.

Volltext