Self-heating effects in AlGaN/GaN HEMT heterostructures: Electrical and optical characterization за авторством Naumov, A.V., Kolomys, O.F., Romanyuk, A.S., Tsykaniuk, B.I., Strelchuk, V.V., Trius, M.P., Avksentyev, A.Yu., Belyaev, A.E.

Отримати повний текст

Current instabilities in resonant tunnelling diodes based on GaN/AlN heterojunctions за авторством Belyaev, A.E., Foxon, C.T., Novikov, S.V., Makarovsky, O., Eaves, L., Kappers, M.J., Barnard, J.S., Humphreys, C.J., Danylyuk, S.V., Vitusevich, S.A., Naumov, A.V.

Отримати повний текст

Investigation of resistance formation mechanisms for contacts to n-AlN and n-GaN with a high dislocation density за авторством Sachenko, A.V., Belyaev, A.E., Boltovets, N.S., Zhilyaev, Yu.V., Kapitanchuk, L.M., Klad’ko, V.P., Konakova, R.V., Kudryk, Ya.Ya., Kuchuk, A.V., Naumov, A.V., Panteleev, V.V., Sheremet, V.N.

Отримати повний текст