Харвестер відкритої науки НАН України

Borophosphosilicate glass component analysis using secondary neutral mass spectrometry

von Oberemok, O., Lytvyn, P.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

AES and XPS characterization of TiN layers formed and modified by ion implantation

von Melnik, V., Popov, V., Kruger, D., Oberemok, O.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Ultrasound effect on radiation damages in boron implanted silicon

von Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Механiзми модифiкацiї профiлiв розподiлу домiшок при мас-спектрометричному аналiзi багатошарових наноструктур...

von Efremov, A. A., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Romanyuk, B. M.
Veröffentlicht 2019

Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film

von Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.
Veröffentlicht in Functional Materials (2016)

Light-induced mass transport in amorphous chalcogenides/gold nanoparticles composites

von Trunov, M.L., Lytvyn, P.M., Nagy, P.M., Oberemok, O.S., Durkot, M.O., Tarnaii, A.A., Prokopenko, I.V., Rubish, V.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2013)

Formation of silicon nanoclusters in buried ultra-thin oxide layers

von Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)

Дослiдження рекомбiнацiйних характеристик Cz-кремнiю, iмплантованого iонами залiза

von Gamov, D. V., Gudymenko, O. I., Kladko, V. P., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Polishchuk, Yu. O., Romaniuk, B. M., Chernenko, V. V., Nasekа, V. M.
Veröffentlicht 2018