Study of postimplantation annealing of SiC von Avramenko, S.F., Kiselev, V.S., Romanyuk, B.N., Valakh, M.Ya.

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Activation of porous Si blue emission due to preanodization ion implantation von Rozhin, A.G., Klyui, N.I., Litovchenko, V.G., Melnik, V.P., Romanyuk, B.N., Piryatinskii, Yu.P.

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Investigations of impurity gettering in multicrystalline silicon von Evtukh, A.A., Litovchenko, V.G., Oberemok, A.S., Popov, V.G., Rassamakin, Yu.V., Romanyuk, B.N., Volkov, S.G.

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Electrical properties of MIS structures with silicon nanoclusters von Bunak, S.V., Ilchenko, V.V., Melnik, V.P., Hatsevych, I.M., Romanyuk, B.N., Shkavro, A.G., Tretyak, O.V.

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