Search Results - Shwarts, Yu.M.
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Микроэлектронные термодиодные сенсоры экстремальной электроники by Shwarts, Yu. M., Shwarts, M. M.
Published 2005Get full text
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A new method of extraction of a p-n diode series resistance from I-V characteristics and its application to analysis of low-temperature conduction of the diode base by Borblik, V.L., Shwarts, Yu.M., Shwarts, M.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2009)Get full text
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Диодный сенсор температуры: анализ приборной погрешности измерения by Ivashchenko, A. N., Shwarts, Yu. M., Shwarts, М. M.
Published 2005Get full text
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Peculiarities of injection phenomena in heavily doped silicon structures and development of radiation-resistant diode temperature sensors by Shwarts, Yu.M., Sokolov, V.N., Shwarts, M.M., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)Get full text
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Effect of magnetic field on hysteretic characteristics of silicon diodes under conditions of low-temperature impurity breakdown by Aleinikov, A.B., Berezovets, V.A., Borblik, V.L., Shwarts, M.M., Shwarts, Yu.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2012)Get full text
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Nanocrystalline Ge films created by thermal vacuum deposition on GaAs substrates: structural and electric properties by Borblik, V.L., Korchevoi, A.A., Nikolenko, A.S., Strelchuk, V.V., Fonkich, A.M., Shwarts, Yu.M., Shwarts, M.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)Get full text
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Related Subjects
sensor
temperature
сенсор
температура
GaP
Si
accuracy
approximation
diode
extreme electronics
measurement
neural network
p-n-переход
p–n junction
silicon diode
thermometric characteristic
аппроксимация
диод
измерение
кремниевый диод
нейронная сеть
термометрическая характеристика
точность
экстремальная электроника