Suchergebnisse - Shwarts, Yu.M.
- Treffer 1 - 12 von 12
-
1
-
2
-
3
-
4
A new method of extraction of a p-n diode series resistance from I-V characteristics and its application to analysis of low-temperature conduction of the diode base von Borblik, V.L., Shwarts, Yu.M., Shwarts, M.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2009)Volltext
Artikel -
5
-
6
Peculiarities of injection phenomena in heavily doped silicon structures and development of radiation-resistant diode temperature sensors von Shwarts, Yu.M., Sokolov, V.N., Shwarts, M.M., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)Volltext
Artikel -
7
-
8
Optimized calibration of cryogenic silicon thermodiodes von Ivashchenko, O.M., Shwarts, Yu.M., Shwarts, M.M., Kopko, D.P., Sypko, M.I.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)Volltext
Artikel -
9
Effect of magnetic field on hysteretic characteristics of silicon diodes under conditions of low-temperature impurity breakdown von Aleinikov, A.B., Berezovets, V.A., Borblik, V.L., Shwarts, M.M., Shwarts, Yu.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2012)Volltext
Artikel -
10
-
11
Nanocrystalline Ge films created by thermal vacuum deposition on GaAs substrates: structural and electric properties von Borblik, V.L., Korchevoi, A.A., Nikolenko, A.S., Strelchuk, V.V., Fonkich, A.M., Shwarts, Yu.M., Shwarts, M.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)Volltext
Artikel -
12
Исследование термометрических характеристик GaP-диодов p+–n-типа von Krasnov, V. A., Shwarts, Yu. M., Shwarts, М. M., Kopko, D. P., Erohin, S. Yu., Fonkich, A. М., Shutov, S. V., Sypko, N. I.
Veröffentlicht 2008Volltext
Artikel