Thermoelastic stresses and defect production in semiconductor-insulator structures at isothermic heating за авторством Agueev, O.A., Svetlichnyi, A.M.

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Effect of microwave radiation on optical transmission spectra in SiO₂/SiC structures за авторством Bacherikov, Yu.Yu., Konakova, R.V., Kolyadina, E.Yu., Kocherov, A.N., Okhrimenko, O.B., Svetlichnyi, A.M.

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Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures за авторством Bacherikov, Yu.Yu., Konakova, R.V., Okhrimenko, O.B., Berezovska, N.I., Kapitanchuk, L.M., Svetlichnyi, A.M.

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Modification of properties of the glass-Si₃N₄-Si-SiO₂ structure at laser treatment за авторством Konakova, R.V., Kladko, V.P., Lytvyn, O.S., Okhrimenko, O.B., Konoplev, B.G., Svetlichnyi, A.M., Lissotschenko, V.N.

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Thin dysprosium oxide films formed by rapid thermal annealing on porous SiC substrates за авторством Bacherikov, Yu.Yu., Konakova, R.V., Okhrimenko, O.B., Berezovska, N.I., Lytvyn, O.S., Kapitanchuk, L.M., Svetlichnyi, A.M.

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Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates за авторством Bacherikov, Yu.Yu., Dmitruk, N.L., Konakova, R.V., Kolomys, O.F., Okhrimenko, O.B., Strelchuk, V.V., Lytvyn, O.S., Kapitanchuk, L.M., Svetlichnyi, A.M.

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