Thermoelastic stresses and defect production in semiconductor-insulator structures at isothermic heating von Agueev, O.A., Svetlichnyi, A.M.

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Effect of microwave radiation on optical transmission spectra in SiO₂/SiC structures von Bacherikov, Yu.Yu., Konakova, R.V., Kolyadina, E.Yu., Kocherov, A.N., Okhrimenko, O.B., Svetlichnyi, A.M.

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Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures von Bacherikov, Yu.Yu., Konakova, R.V., Okhrimenko, O.B., Berezovska, N.I., Kapitanchuk, L.M., Svetlichnyi, A.M.

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Modification of properties of the glass-Si₃N₄-Si-SiO₂ structure at laser treatment von Konakova, R.V., Kladko, V.P., Lytvyn, O.S., Okhrimenko, O.B., Konoplev, B.G., Svetlichnyi, A.M., Lissotschenko, V.N.

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Thin dysprosium oxide films formed by rapid thermal annealing on porous SiC substrates von Bacherikov, Yu.Yu., Konakova, R.V., Okhrimenko, O.B., Berezovska, N.I., Lytvyn, O.S., Kapitanchuk, L.M., Svetlichnyi, A.M.

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Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates von Bacherikov, Yu.Yu., Dmitruk, N.L., Konakova, R.V., Kolomys, O.F., Okhrimenko, O.B., Strelchuk, V.V., Lytvyn, O.S., Kapitanchuk, L.M., Svetlichnyi, A.M.

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