Investigation of cadmium telluride films on silicon substrate von Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.

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Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry von Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.

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Infrared spectroscopy and electroreflectance in the region of fundamental optical transition E₀ of heavily doped n-GaAs (100) von Gentsar, P.O., Vlasenko, O.I., Vuichyk, M.V., Stronski, O.V.

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Morphologic and optical characterization of ZnO:Co thin films grown by PLD von Vuichyk, M.V., Tsybrii, Z.F., Lavoryk, S.R., Svezhentsova, K.V., Virt, I.S., Chizhov, A.

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Optical properties of AlN/n-Si(111) films obtained by method of HF reactive magnetron sputtering von Zayats, M.S., Boiko, V.G., Gentsar, P.O., Vuichyk, M.V., Lytvyn, O.S., Stronski, A.V.

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THz linear array scanner in application to the real-time imaging and convolutional neural network recognition von Golenkov, A.G., Shevchik-Shekera, A.V., Kovbasa, M.Yu., Lysiuk, I.O., Vuichyk, M.V., Korinets, S.V., Bunchuk, S.G., Dukhnin, S.E., Reva, V.P., Sizov, F.F.

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Дискретні фотоприймачі середньохвильового ІЧ-діапазону спектру на основі HgCdTe von Tsybrii, Z. F., Andreeva, K. V., Apatska, M. V., Bunchuk, S. G., Vuichyk, M. V., Golenkov, O. G., Dmytruk, N. V., Zabudsky, V. V., Lysiuk, I. O., Svezhentsova, K. V., Smolii, M. I., Sizov, F. F.

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