Modeling of X-ray rocking curves for layers after two-stage ion-implantation за авторством O. I. Liubchenko, V. P. Kladko, Yo. Gudymenko

Отримати повний текст

Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry за авторством I. M. Fodchuk, V. V. Dovganyuk, T. V. Litvinchuk, V. P. Kladko, M. V. Slobodian, Yo. Gudymenko, Z. Swiatek

Отримати повний текст

Structural properties of chalcogenide glasses As2Se3 doped with manganese за авторством O. P. Paiuk, L. A. Revutska, A. V. Stronski, Yo. Gudymenko, H. V. Stanchu, A. A. Gubanova, Ts. A. Kryskov

Отримати повний текст

Influence of microwave radiation on relaxation processes in silicon carbide за авторством Yu. Yu. Bacherikov, Yu. Goroneskul, Yo. Gudymenko, V. P. Kladko, O. F. Kolomys, I. M. Krishchenko, O. B. Okhrimenko, V. V. Strelchuk

Отримати повний текст

Formation of silicon nanoclusters in buried ultra-thin oxide layers за авторством O. S. Oberemok, V. G. Litovchenko, D. V. Gamov, V. G. Popov, V. P. Melnik, Yo. Gudymenko, V. A. Nikirin, I. M. Khatsevich

Отримати повний текст

Influence of small miscuts on self-ordered growth of Ge nanoislands за авторством Yo. Gudymenko, V. P. Kladko, O. M. Yefanov, M. V. Slobodian, Yu. S. Polischuk, Z. F. Krasilnik, D. V. Lobanov, A. A. Novikov

Отримати повний текст

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient за авторством T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk

Отримати повний текст

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data за авторством M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko

Отримати повний текст

Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics за авторством V. A. Vashchenko, I. V. Yatsenko, Yu. I. Kovalenko, V. P. Kladko, Yo. Gudymenko, P. M. Lytvyn, A. A. Korchovyi, S. V. Mamykin, O. S. Kondratenko, V. P. Maslov, H. V. Dorozinska, G. V. Dorozinsky

Отримати повний текст