Modeling of X-ray rocking curves for layers after two-stage ion-implantation by O. I. Liubchenko, V. P. Kladko, Yo. Gudymenko

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Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry by I. M. Fodchuk, V. V. Dovganyuk, T. V. Litvinchuk, V. P. Kladko, M. V. Slobodian, Yo. Gudymenko, Z. Swiatek

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Structural properties of chalcogenide glasses As2Se3 doped with manganese by O. P. Paiuk, L. A. Revutska, A. V. Stronski, Yo. Gudymenko, H. V. Stanchu, A. A. Gubanova, Ts. A. Kryskov

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Influence of microwave radiation on relaxation processes in silicon carbide by Yu. Yu. Bacherikov, Yu. Goroneskul, Yo. Gudymenko, V. P. Kladko, O. F. Kolomys, I. M. Krishchenko, O. B. Okhrimenko, V. V. Strelchuk

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Formation of silicon nanoclusters in buried ultra-thin oxide layers by O. S. Oberemok, V. G. Litovchenko, D. V. Gamov, V. G. Popov, V. P. Melnik, Yo. Gudymenko, V. A. Nikirin, I. M. Khatsevich

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Influence of small miscuts on self-ordered growth of Ge nanoislands by Yo. Gudymenko, V. P. Kladko, O. M. Yefanov, M. V. Slobodian, Yu. S. Polischuk, Z. F. Krasilnik, D. V. Lobanov, A. A. Novikov

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient by T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data by M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko

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Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics by V. A. Vashchenko, I. V. Yatsenko, Yu. I. Kovalenko, V. P. Kladko, Yo. Gudymenko, P. M. Lytvyn, A. A. Korchovyi, S. V. Mamykin, O. S. Kondratenko, V. P. Maslov, H. V. Dorozinska, G. V. Dorozinsky

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