Modeling of X-ray rocking curves for layers after two-stage ion-implantation von O. I. Liubchenko, V. P. Kladko, Yo. Gudymenko

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Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry von I. M. Fodchuk, V. V. Dovganyuk, T. V. Litvinchuk, V. P. Kladko, M. V. Slobodian, Yo. Gudymenko, Z. Swiatek

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Structural properties of chalcogenide glasses As2Se3 doped with manganese von O. P. Paiuk, L. A. Revutska, A. V. Stronski, Yo. Gudymenko, H. V. Stanchu, A. A. Gubanova, Ts. A. Kryskov

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Influence of microwave radiation on relaxation processes in silicon carbide von Yu. Yu. Bacherikov, Yu. Goroneskul, Yo. Gudymenko, V. P. Kladko, O. F. Kolomys, I. M. Krishchenko, O. B. Okhrimenko, V. V. Strelchuk

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Formation of silicon nanoclusters in buried ultra-thin oxide layers von O. S. Oberemok, V. G. Litovchenko, D. V. Gamov, V. G. Popov, V. P. Melnik, Yo. Gudymenko, V. A. Nikirin, I. M. Khatsevich

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Influence of small miscuts on self-ordered growth of Ge nanoislands von Yo. Gudymenko, V. P. Kladko, O. M. Yefanov, M. V. Slobodian, Yu. S. Polischuk, Z. F. Krasilnik, D. V. Lobanov, A. A. Novikov

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient von T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data von M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko

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Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics von V. A. Vashchenko, I. V. Yatsenko, Yu. I. Kovalenko, V. P. Kladko, Yo. Gudymenko, P. M. Lytvyn, A. A. Korchovyi, S. V. Mamykin, O. S. Kondratenko, V. P. Maslov, H. V. Dorozinska, G. V. Dorozinsky

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