The Study of Amorphous Chalcogenide Materials of Memory Elements Based on Phase Transitions

A stand was developed that allows simultaneously measure the temperature dependences of the electrical resistance (R) and optical transmittance (0) of films in the region of temperatures 300-560 K. The temperature dependences of R and 0 amorphous films of antimony-selenium have been studied. It is s...

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Bibliographic Details
Date:2014
Main Authors: Kyrylenko, V. K., Marjan, V. M., Durkot, M. O., Rubish, V. M.
Format: Article
Language:Ukrainian
Published: Інститут проблем реєстрації інформації НАН України 2014
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Online Access:http://drsp.ipri.kiev.ua/article/view/100252
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Journal Title:Data Recording, Storage & Processing

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Data Recording, Storage & Processing