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Determination of surface parameters of solids by methods of X-ray total external reflection

Determination of surface parameters of solids by methods of X-ray total external reflection

The series of GaAs and SiO₂ samples with the specially prepared one- and two-dimensional surface reliefs have been investigated by the methods of integral and differential curve total external reflection of X-rays. The direct and inverse problem was solved, taking into consideration data obtained by...

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Bibliographic Details
Main Authors: Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/117940
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http://dspace.nbuv.gov.ua/handle/123456789/117940

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