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Morphologic and optical characterization of ZnO:Co thin films grown by PLD

The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically d...

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Main Authors: Vuichyk, M.V., Tsybrii, Z.F., Lavoryk, S.R., Svezhentsova, K.V., Virt, I.S., Chizhov, A.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/118359
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spelling irk-123456789-1183592017-05-31T03:04:10Z Morphologic and optical characterization of ZnO:Co thin films grown by PLD Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically developed surface of films has been analyzed. The experimental transmission and reflectance spectra in the visible region have been measured. In the framework of the dielectric function, the optical constants n and k and dispersion parameters of oscillators that provide the best fit with experimental data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It gives a possibility to suppose that the obtained films possess the wurtzite structure. 2014 Article Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS 68.37.Ps, 78.20.Ci, 78.30.-j http://dspace.nbuv.gov.ua/handle/123456789/118359 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically developed surface of films has been analyzed. The experimental transmission and reflectance spectra in the visible region have been measured. In the framework of the dielectric function, the optical constants n and k and dispersion parameters of oscillators that provide the best fit with experimental data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It gives a possibility to suppose that the obtained films possess the wurtzite structure.
format Article
author Vuichyk, M.V.
Tsybrii, Z.F.
Lavoryk, S.R.
Svezhentsova, K.V.
Virt, I.S.
Chizhov, A.
spellingShingle Vuichyk, M.V.
Tsybrii, Z.F.
Lavoryk, S.R.
Svezhentsova, K.V.
Virt, I.S.
Chizhov, A.
Morphologic and optical characterization of ZnO:Co thin films grown by PLD
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Vuichyk, M.V.
Tsybrii, Z.F.
Lavoryk, S.R.
Svezhentsova, K.V.
Virt, I.S.
Chizhov, A.
author_sort Vuichyk, M.V.
title Morphologic and optical characterization of ZnO:Co thin films grown by PLD
title_short Morphologic and optical characterization of ZnO:Co thin films grown by PLD
title_full Morphologic and optical characterization of ZnO:Co thin films grown by PLD
title_fullStr Morphologic and optical characterization of ZnO:Co thin films grown by PLD
title_full_unstemmed Morphologic and optical characterization of ZnO:Co thin films grown by PLD
title_sort morphologic and optical characterization of zno:co thin films grown by pld
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2014
url http://dspace.nbuv.gov.ua/handle/123456789/118359
citation_txt Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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AT tsybriizf morphologicandopticalcharacterizationofznocothinfilmsgrownbypld
AT lavoryksr morphologicandopticalcharacterizationofznocothinfilmsgrownbypld
AT svezhentsovakv morphologicandopticalcharacterizationofznocothinfilmsgrownbypld
AT virtis morphologicandopticalcharacterizationofznocothinfilmsgrownbypld
AT chizhova morphologicandopticalcharacterizationofznocothinfilmsgrownbypld
first_indexed 2023-10-18T20:31:48Z
last_indexed 2023-10-18T20:31:48Z
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