Morphologic and optical characterization of ZnO:Co thin films grown by PLD
The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically d...
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| Дата: | 2014 |
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| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118359 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
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irk-123456789-1183592017-05-31T03:04:10Z Morphologic and optical characterization of ZnO:Co thin films grown by PLD Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically developed surface of films has been analyzed. The experimental transmission and reflectance spectra in the visible region have been measured. In the framework of the dielectric function, the optical constants n and k and dispersion parameters of oscillators that provide the best fit with experimental data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It gives a possibility to suppose that the obtained films possess the wurtzite structure. 2014 Article Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS 68.37.Ps, 78.20.Ci, 78.30.-j http://dspace.nbuv.gov.ua/handle/123456789/118359 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The morphological properties of the surface and optical characteristics of
nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and
sapphire by pulsed laser deposition (PLD) method have been studied. The influence of
thermal annealing on formation of characteristically developed surface of films has been
analyzed. The experimental transmission and reflectance spectra in the visible region
have been measured. In the framework of the dielectric function, the optical constants n
and k and dispersion parameters of oscillators that provide the best fit with experimental
data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the
frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It
gives a possibility to suppose that the obtained films possess the wurtzite structure. |
| format |
Article |
| author |
Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| spellingShingle |
Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. Morphologic and optical characterization of ZnO:Co thin films grown by PLD Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Vuichyk, M.V. Tsybrii, Z.F. Lavoryk, S.R. Svezhentsova, K.V. Virt, I.S. Chizhov, A. |
| author_sort |
Vuichyk, M.V. |
| title |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_short |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_full |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_fullStr |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_full_unstemmed |
Morphologic and optical characterization of ZnO:Co thin films grown by PLD |
| title_sort |
morphologic and optical characterization of zno:co thin films grown by pld |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2014 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118359 |
| citation_txt |
Morphologic and optical characterization
of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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| first_indexed |
2023-10-18T20:31:48Z |
| last_indexed |
2023-10-18T20:31:48Z |
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