Influence of complex defects on electrophysical properties of GaP light emitting diodes

In order to estimate the role of complex defects on GaP light emitting diodes (LED) operation, luminescent and electrical characteristics of GaP LEDs irradiated with reactor neutrons have been studied. It has been stated that nonradiative levels of radiation defects affect electroluminescence que...

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Бібліографічні деталі
Дата:2014
Автори: Konoreva, O., Malyj, E., Mamykin, S., Petrenko, I., Pinkovska, M., Tartachnyk, V.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118369
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Influence of complex defects on electrophysical properties of GaP light emitting diodes / O. Konoreva, E. Malyj, S. Mamykin, I. Petrenko, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 2. — С. 184-187. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-118369
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spelling irk-123456789-1183692017-05-31T03:06:09Z Influence of complex defects on electrophysical properties of GaP light emitting diodes Konoreva, O. Malyj, E. Mamykin, S. Petrenko, I. Pinkovska, M. Tartachnyk, V. In order to estimate the role of complex defects on GaP light emitting diodes (LED) operation, luminescent and electrical characteristics of GaP LEDs irradiated with reactor neutrons have been studied. It has been stated that nonradiative levels of radiation defects affect electroluminescence quenching. From the analysis of the tunnel current, the density of dislocations in the depleted part of the p–n junction was obtained. Neutron induced disorder regions do not change the tunnel component of the direct current of red diodes, increasing the dislocation density, because the carrier flow along the “tunnel shunts” is blocked. 2014 Article Influence of complex defects on electrophysical properties of GaP light emitting diodes / O. Konoreva, E. Malyj, S. Mamykin, I. Petrenko, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 2. — С. 184-187. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 29.40.-n, 85.30.-z, 85.60.Dw http://dspace.nbuv.gov.ua/handle/123456789/118369 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description In order to estimate the role of complex defects on GaP light emitting diodes (LED) operation, luminescent and electrical characteristics of GaP LEDs irradiated with reactor neutrons have been studied. It has been stated that nonradiative levels of radiation defects affect electroluminescence quenching. From the analysis of the tunnel current, the density of dislocations in the depleted part of the p–n junction was obtained. Neutron induced disorder regions do not change the tunnel component of the direct current of red diodes, increasing the dislocation density, because the carrier flow along the “tunnel shunts” is blocked.
format Article
author Konoreva, O.
Malyj, E.
Mamykin, S.
Petrenko, I.
Pinkovska, M.
Tartachnyk, V.
spellingShingle Konoreva, O.
Malyj, E.
Mamykin, S.
Petrenko, I.
Pinkovska, M.
Tartachnyk, V.
Influence of complex defects on electrophysical properties of GaP light emitting diodes
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Konoreva, O.
Malyj, E.
Mamykin, S.
Petrenko, I.
Pinkovska, M.
Tartachnyk, V.
author_sort Konoreva, O.
title Influence of complex defects on electrophysical properties of GaP light emitting diodes
title_short Influence of complex defects on electrophysical properties of GaP light emitting diodes
title_full Influence of complex defects on electrophysical properties of GaP light emitting diodes
title_fullStr Influence of complex defects on electrophysical properties of GaP light emitting diodes
title_full_unstemmed Influence of complex defects on electrophysical properties of GaP light emitting diodes
title_sort influence of complex defects on electrophysical properties of gap light emitting diodes
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2014
url http://dspace.nbuv.gov.ua/handle/123456789/118369
citation_txt Influence of complex defects on electrophysical properties of GaP light emitting diodes / O. Konoreva, E. Malyj, S. Mamykin, I. Petrenko, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 2. — С. 184-187. — Бібліогр.: 9 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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first_indexed 2023-10-18T20:31:58Z
last_indexed 2023-10-18T20:31:58Z
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