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Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers
The review concentrates on the analysis of the RF hydrogen plasma effect on thin-film metal-dioxide-silicon and silicon-dioxide silicon structures which are a modern basis of micro- and nanoelectronics. The especial attention is paid to athermic mechanisms of transformation of defects in dioxi...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/118855 |
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irk-123456789-1188552017-06-01T03:06:58Z Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers Nazarov, A.N. Lysenko, V.S. Nazarova, T.M. The review concentrates on the analysis of the RF hydrogen plasma effect on thin-film metal-dioxide-silicon and silicon-dioxide silicon structures which are a modern basis of micro- and nanoelectronics. The especial attention is paid to athermic mechanisms of transformation of defects in dioxide, SiO₂-Si interface and SiO₂-Si nanocrystal ones and thin layers of silicon; atomic hydrogen influence on the annealing of vacancy defects and the implanted impurity activation in a subsurface implanted silicon layer; and the hydrogen plasma effect on luminescent properties of nanostructured light emitting materials. 2008 Article Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers / A.N. Nazarov, V.S. Lysenko, T.M. Nazarova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 101-123. — Бібліогр.: 143 назв. — англ. 1560-8034 PACS 52.77.-j, 61.72.Tt, 68.55.Jk, 73.63.-b http://dspace.nbuv.gov.ua/handle/123456789/118855 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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English |
description |
The review concentrates on the analysis of the RF hydrogen plasma effect on
thin-film metal-dioxide-silicon and silicon-dioxide silicon structures which are a modern
basis of micro- and nanoelectronics. The especial attention is paid to athermic
mechanisms of transformation of defects in dioxide, SiO₂-Si interface and SiO₂-Si
nanocrystal ones and thin layers of silicon; atomic hydrogen influence on the annealing
of vacancy defects and the implanted impurity activation in a subsurface implanted
silicon layer; and the hydrogen plasma effect on luminescent properties of nanostructured
light emitting materials. |
format |
Article |
author |
Nazarov, A.N. Lysenko, V.S. Nazarova, T.M. |
spellingShingle |
Nazarov, A.N. Lysenko, V.S. Nazarova, T.M. Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Nazarov, A.N. Lysenko, V.S. Nazarova, T.M. |
author_sort |
Nazarov, A.N. |
title |
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers |
title_short |
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers |
title_full |
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers |
title_fullStr |
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers |
title_full_unstemmed |
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers |
title_sort |
hydrogen plasma treatment of silicon thin-film structures and nanostructured layers |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2008 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/118855 |
citation_txt |
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers / A.N. Nazarov, V.S. Lysenko, T.M. Nazarova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 101-123. — Бібліогр.: 143 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT nazarovan hydrogenplasmatreatmentofsiliconthinfilmstructuresandnanostructuredlayers AT lysenkovs hydrogenplasmatreatmentofsiliconthinfilmstructuresandnanostructuredlayers AT nazarovatm hydrogenplasmatreatmentofsiliconthinfilmstructuresandnanostructuredlayers |
first_indexed |
2023-10-18T20:33:09Z |
last_indexed |
2023-10-18T20:33:09Z |
_version_ |
1796150500949753856 |