Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric
Charge trapping in ultrathin high-k Gd₂O₃ dielectric leading to appearance of hysteresis in C–V curves is studied by capacitance-voltage, conductance-frequency and current-voltage techniques at different temperatures. It was shown that the large leakage current at a negative gate voltage causes t...
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Дата: | 2008 |
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Автори: | , , , , , , , , |
Формат: | Стаття |
Мова: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/119074 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric / A. N. Nazarov, Y. V. Gomeniuk, Y. Y. Gomeniuk, V. S. Lysenko, H. D. B. Gottlob, M. Schmidt, M. C. Lemme, M. Czernohorsky, H. J. Ostenc // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 4. — С. 324-328. — Бібліогр.: 12 назв. — англ. |
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irk-123456789-1190742017-06-04T03:03:42Z Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric Nazarov, A.N. Gomeniuk, Y.V. Gomeniuk, Y.Y. Lysenko, V.S. Gottlob, H.D.B. Schmidt, M. Lemme, M.C. Czernohorsky, M. Ostenc, H.J. Charge trapping in ultrathin high-k Gd₂O₃ dielectric leading to appearance of hysteresis in C–V curves is studied by capacitance-voltage, conductance-frequency and current-voltage techniques at different temperatures. It was shown that the large leakage current at a negative gate voltage causes the reversible trapping of the positive charge in the dielectric layer, without electrical degradation of the dielectric and dielectricsemiconductor interface. The capture cross-sections of the hole traps are around 10⁻¹⁸ and 2 × 10⁻²⁰ cm² . The respective shift of the C–V curve correlates with a “plateau” at the capacitance corresponding to weak accumulation at the silicon interface. 2008 Article Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric / A. N. Nazarov, Y. V. Gomeniuk, Y. Y. Gomeniuk, V. S. Lysenko, H. D. B. Gottlob, M. Schmidt, M. C. Lemme, M. Czernohorsky, H. J. Ostenc // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 4. — С. 324-328. — Бібліогр.: 12 назв. — англ. 1560-8034 PACS 73.20.-r http://dspace.nbuv.gov.ua/handle/123456789/119074 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
description |
Charge trapping in ultrathin high-k Gd₂O₃ dielectric leading to appearance of
hysteresis in C–V curves is studied by capacitance-voltage, conductance-frequency and
current-voltage techniques at different temperatures. It was shown that the large leakage
current at a negative gate voltage causes the reversible trapping of the positive charge in
the dielectric layer, without electrical degradation of the dielectric and dielectricsemiconductor
interface. The capture cross-sections of the hole traps are around 10⁻¹⁸ and
2 × 10⁻²⁰ cm²
. The respective shift of the C–V curve correlates with a “plateau” at the
capacitance corresponding to weak accumulation at the silicon interface. |
format |
Article |
author |
Nazarov, A.N. Gomeniuk, Y.V. Gomeniuk, Y.Y. Lysenko, V.S. Gottlob, H.D.B. Schmidt, M. Lemme, M.C. Czernohorsky, M. Ostenc, H.J. |
spellingShingle |
Nazarov, A.N. Gomeniuk, Y.V. Gomeniuk, Y.Y. Lysenko, V.S. Gottlob, H.D.B. Schmidt, M. Lemme, M.C. Czernohorsky, M. Ostenc, H.J. Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Nazarov, A.N. Gomeniuk, Y.V. Gomeniuk, Y.Y. Lysenko, V.S. Gottlob, H.D.B. Schmidt, M. Lemme, M.C. Czernohorsky, M. Ostenc, H.J. |
author_sort |
Nazarov, A.N. |
title |
Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric |
title_short |
Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric |
title_full |
Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric |
title_fullStr |
Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric |
title_full_unstemmed |
Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric |
title_sort |
novel hysteresis effect in ultrathin epitaxial gd₂o₃ high-k dielectric |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2008 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/119074 |
citation_txt |
Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric / A. N. Nazarov, Y. V. Gomeniuk, Y. Y. Gomeniuk, V. S. Lysenko, H. D. B. Gottlob, M. Schmidt, M. C. Lemme, M. Czernohorsky, H. J. Ostenc // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 4. — С. 324-328. — Бібліогр.: 12 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
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first_indexed |
2023-10-18T20:33:41Z |
last_indexed |
2023-10-18T20:33:41Z |
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