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Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method
Relations between the Keldysh-Franz oscillations with electron parameters of semiconductor materials were used to derive qualitative data for homoepitaxial films n-GaAs (100) from their electroreflectance spectra. The spectra were measured using the Shottky barrier method at the temperature 300 K an...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2005
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| Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/121570 |
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irk-123456789-1215702017-06-15T03:02:58Z Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method Gentsar, P.A. Vlasenko, A.I. Kudryavtsev, A.A. Relations between the Keldysh-Franz oscillations with electron parameters of semiconductor materials were used to derive qualitative data for homoepitaxial films n-GaAs (100) from their electroreflectance spectra. The spectra were measured using the Shottky barrier method at the temperature 300 K and non-polarized light from the range 1.3-1.65 eV in vicinity of E0 transition (Г8v → Г6с). The spectral data enabled to get values of the following electron parameters: the energy of the electron transition, electrooptical energy, surface electric field, phenomenological parameter of widening, charge carrier relaxation time by energy, relative phase factor, extension of the wave function oscillation and the value of electron mobility. The obtained values are in a good agreement with known data for structurally perfect n-GaAs with the electron concentration n = 10¹⁷ – 10¹⁸ cm⁻³ . 2005 Article Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method / P.A. Gentsar, A.I. Vlasenko, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 85-90. — Бібліогр.: 16 назв. — англ. 1560-8034 PACS 78.20.Jq, 78.40.Fy, 78.68.+m http://dspace.nbuv.gov.ua/handle/123456789/121570 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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English |
| description |
Relations between the Keldysh-Franz oscillations with electron parameters of semiconductor materials were used to derive qualitative data for homoepitaxial films n-GaAs (100) from their electroreflectance spectra. The spectra were measured using the Shottky barrier method at the temperature 300 K and non-polarized light from the range 1.3-1.65 eV in vicinity of E0 transition (Г8v → Г6с). The spectral data enabled to get values of the following electron parameters: the energy of the electron transition, electrooptical energy, surface electric field, phenomenological parameter of widening, charge carrier relaxation time by energy, relative phase factor, extension of the wave function oscillation and the value of electron mobility. The obtained values are in a good agreement with known data for structurally perfect n-GaAs with the electron concentration n = 10¹⁷ – 10¹⁸ cm⁻³ . |
| format |
Article |
| author |
Gentsar, P.A. Vlasenko, A.I. Kudryavtsev, A.A. |
| spellingShingle |
Gentsar, P.A. Vlasenko, A.I. Kudryavtsev, A.A. Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Gentsar, P.A. Vlasenko, A.I. Kudryavtsev, A.A. |
| author_sort |
Gentsar, P.A. |
| title |
Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method |
| title_short |
Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method |
| title_full |
Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method |
| title_fullStr |
Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method |
| title_full_unstemmed |
Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method |
| title_sort |
electron properties of semiconductor surface studied by the electroreflectance spectroscopy method |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2005 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/121570 |
| citation_txt |
Electron properties of semiconductor surface studied by the electroreflectance spectroscopy method / P.A. Gentsar, A.I. Vlasenko, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 85-90. — Бібліогр.: 16 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT gentsarpa electronpropertiesofsemiconductorsurfacestudiedbytheelectroreflectancespectroscopymethod AT vlasenkoai electronpropertiesofsemiconductorsurfacestudiedbytheelectroreflectancespectroscopymethod AT kudryavtsevaa electronpropertiesofsemiconductorsurfacestudiedbytheelectroreflectancespectroscopymethod |
| first_indexed |
2023-10-18T20:39:33Z |
| last_indexed |
2023-10-18T20:39:33Z |
| _version_ |
1796150773133869056 |