2025-02-22T17:38:26-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-121585%22&qt=morelikethis&rows=5
2025-02-22T17:38:26-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-121585%22&qt=morelikethis&rows=5
2025-02-22T17:38:26-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-22T17:38:26-05:00 DEBUG: Deserialized SOLR response
Degradation processes in LED modules

Degradation processes in LED modules

Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before...

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Bibliographic Details
Main Authors: Sorokin, V.M., Kudryk, Ya.Ya., Shynkarenko, V.V., Kudryk, R.Ya., Sai, P.O.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/121585
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http://dspace.nbuv.gov.ua/handle/123456789/121585

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