Degradation processes in LED modules
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before...
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| Дата: | 2016 |
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| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2016
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121585 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-121585 |
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dspace |
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irk-123456789-1215852017-06-15T03:05:56Z Degradation processes in LED modules Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%. 2016 Article Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.03.248 PACS 44.05.+e, 02.70.Rr, 42.72.-g http://dspace.nbuv.gov.ua/handle/123456789/121585 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%. |
| format |
Article |
| author |
Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. |
| spellingShingle |
Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. Degradation processes in LED modules Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. |
| author_sort |
Sorokin, V.M. |
| title |
Degradation processes in LED modules |
| title_short |
Degradation processes in LED modules |
| title_full |
Degradation processes in LED modules |
| title_fullStr |
Degradation processes in LED modules |
| title_full_unstemmed |
Degradation processes in LED modules |
| title_sort |
degradation processes in led modules |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2016 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/121585 |
| citation_txt |
Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ. |
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Semiconductor Physics Quantum Electronics & Optoelectronics |
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2023-10-18T20:39:51Z |
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