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Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications

The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main approach applied by us is based on the comparison of the experimental optical a...

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Bibliographic Details
Main Authors: Kudryavtsev, Yu.V., Uvarov, V.M., Gontarz, R., Dubowik, J., Lee, Y.P., Rhee, J.Y., Makogon, Yu.N., Pavlova, E.P.
Format: Article
Language:English
Published: Інститут металофізики ім. Г.В. Курдюмова НАН України 2005
Series:Успехи физики металлов
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/125813
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