Intrinsically shunted Josephson junctions for electronics applications

Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current -voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most su...

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Дата:2017
Автори: Belogolovskii, M., Zhitlukhina, E., Lacquaniti, V., De Leo, N., Fretto, M., Sosso, A.
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2017
Назва видання:Физика низких температур
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Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/129526
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Intrinsically shunted Josephson junctions for electronics applications / M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso // Физика низких температур. — 2017. — Т. 43, № 7. — С. 950-961. — Бібліогр.: 75 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1295262018-01-20T03:05:00Z Intrinsically shunted Josephson junctions for electronics applications Belogolovskii, M. Zhitlukhina, E. Lacquaniti, V. De Leo, N. Fretto, M. Sosso, A. Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current -voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most superconducting digital applications. The usual way to overcome the hysteretic behavior is to place an external low-resistance normal-metal shunt in parallel with each junction. Unfortunately, such solution results in a considerable complication of the circuitry design and introduces parasitic inductance through the junction. This paper provides a concise overview of some generic approaches that have been proposed in order to realize internal shunting in Josephson heterostructures with a barrier that itself contains the desired resistive component. The main attention is paid to self-shunted devices with local weak-link transmission probabilities that are so strongly disordered in the interface plane that transmission probabilities are tiny for the main part of the transition region between two super-conducting electrodes, while a small part of the interface is well transparent. We discuss the possibility of realizing a universal bimodal distribution function and emphasize advantages of such junctions that can be considered as a new class of self-shunted Josephson devices promising for practical applications in superconducting electronics operating at 4.2 K. 2017 Article Intrinsically shunted Josephson junctions for electronics applications / M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso // Физика низких температур. — 2017. — Т. 43, № 7. — С. 950-961. — Бібліогр.: 75 назв. — англ. 0132-6414 PACS: 85.25.Cp, 73.23.–b, 68.55.aj http://dspace.nbuv.gov.ua/handle/123456789/129526 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
spellingShingle Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
Intrinsically shunted Josephson junctions for electronics applications
Физика низких температур
description Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current -voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most superconducting digital applications. The usual way to overcome the hysteretic behavior is to place an external low-resistance normal-metal shunt in parallel with each junction. Unfortunately, such solution results in a considerable complication of the circuitry design and introduces parasitic inductance through the junction. This paper provides a concise overview of some generic approaches that have been proposed in order to realize internal shunting in Josephson heterostructures with a barrier that itself contains the desired resistive component. The main attention is paid to self-shunted devices with local weak-link transmission probabilities that are so strongly disordered in the interface plane that transmission probabilities are tiny for the main part of the transition region between two super-conducting electrodes, while a small part of the interface is well transparent. We discuss the possibility of realizing a universal bimodal distribution function and emphasize advantages of such junctions that can be considered as a new class of self-shunted Josephson devices promising for practical applications in superconducting electronics operating at 4.2 K.
format Article
author Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
author_facet Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
author_sort Belogolovskii, M.
title Intrinsically shunted Josephson junctions for electronics applications
title_short Intrinsically shunted Josephson junctions for electronics applications
title_full Intrinsically shunted Josephson junctions for electronics applications
title_fullStr Intrinsically shunted Josephson junctions for electronics applications
title_full_unstemmed Intrinsically shunted Josephson junctions for electronics applications
title_sort intrinsically shunted josephson junctions for electronics applications
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
publishDate 2017
topic_facet Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
url http://dspace.nbuv.gov.ua/handle/123456789/129526
citation_txt Intrinsically shunted Josephson junctions for electronics applications / M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso // Физика низких температур. — 2017. — Т. 43, № 7. — С. 950-961. — Бібліогр.: 75 назв. — англ.
series Физика низких температур
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first_indexed 2023-10-18T20:58:02Z
last_indexed 2023-10-18T20:58:02Z
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